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author:

郑心城 (郑心城.) [1] | 陈为 (陈为.) [2] (Scholars:陈为)

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CQVIP

Abstract:

磁性元件的绕组损耗是影响电源效率的重要因素.由于绕组损耗机理复杂,更多时候采用有限元软件来分析,但是,这需要大量的计算机资源,也不适合线规优化.本文以环形电感为研究对象,通过Dowell模型分析电感的绕组损耗.采用柱坐标系下的Dowell模型计算环形电感的内外层绕组损耗和两维Dowell模型计算上下层的绕组损耗.实验结果表明,计算精度较高,能够较好地用来评估环形电感的绕组损耗.

Keyword:

Dowell模型 环形电感 绕组损耗

Community:

  • [ 1 ] [郑心城]福州大学
  • [ 2 ] [陈为]福州大学

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Source :

电气开关

ISSN: 1004-289X

CN: 21-1279/TM

Year: 2017

Issue: 6

Volume: 55

Page: 57-61,64

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 4

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