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author:

Shao, Zhenguo (Shao, Zhenguo.) [1] (Scholars:邵振国) | Wu, Danyue (Wu, Danyue.) [2] | Zhang, Ronglin (Zhang, Ronglin.) [3] | Kang, Jian (Kang, Jian.) [4]

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EI Scopus

Abstract:

The bulk dynamic load could make the voltage of Point of Common Coupling (PCC) fluctuate and results in flicker. It usually transforms in power grid and perhaps exists in several voltage ranks. In order to mitigate flicker locally, the disturbance source location is desirably solved. Flickermeter is helpful to confirm if there is flicker at the detecting bus. But its reading indicates the accumulative intensity containing upper background disturbance and down load disturbance. It can not point out whether the main disturbance source results from upper side or downside. Supposing that only one load is feed without background disturbance, flicker intensity detected at PCC can represent the intensity level of that load. A responsibility allocation algorithm derived from that fact is proposed in this paper. It tracks the impedance of loads using wavelet-transform based method from operating data, computes the virtual voltage of PCC according to the percent of system impedance to load impedance and calculates the respective flicker intensity for each interference load. The flicker intensity corresponds to the hazard level of each customer. A Real Time Digital Simulation (RTDS) test of Flicker Source Location System (FSLS) and a practical application in Fujian Grid are introduced in this paper too. ©2010 IEEE.

Keyword:

Dynamic loads Electric fault currents Electric power transmission networks Hazards Location Power quality Wavelet transforms

Community:

  • [ 1 ] [Shao, Zhenguo]College of Electrical Engineering and Automation, Fuzhou University, Fuzhou, China
  • [ 2 ] [Wu, Danyue]System Laboratory, Fujian Electric Power Test and Research Institute, Fuzhou, China
  • [ 3 ] [Zhang, Ronglin]System Laboratory, Fujian Electric Power Test and Research Institute, Fuzhou, China
  • [ 4 ] [Kang, Jian]College of Electrical Engineering and Automation, Fuzhou University, Fuzhou, China

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ISSN: 2157-4839

Year: 2010

Language: English

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count: 3

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 2

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