The　prediction　technology　of　the　conducted　EMI　of　SMPS　is　an　effective　way　to　reduce　the　EMI　debug　period　and　costs.　The　traditional　prediction　technology　mainly　focused　on　the　self-model　of　the　component　and　paid　little　attention　to　the　electromagnetic　coupling　between　the　components　in　SMPS.　This　paper　proposed　an　optimal　prediction　method　with　near-filed　electromagnetic　coupling　parameters　in　which　the　electromagnetic　coupling　parameters　are　got　by　HFSS　simulation　or　test　results.　Finally,　the　consistency　between　the　prediction　result　and　the　prototype　test　result　of　the　conducted　EMI　verifies　the　optimal　prediction　method　to　be　correct　and　flexible.　©　2015　IEEE.