A　dual　parameter　on-chip　test　platform　(-　tester)　based　on　thermal　actuator　is　introduced　in　this　paper,　used　to　extract　static　tensile　fracture　strength　and　dynamic　impact　bending　fracture　strength.　Process　quality　can　be　evaluated　based　on　the　extracted　fracture　strength　parameters.　The　tester　has　the　characteristics　of　quantifiable　readout　without　relying　on　precision　equipment.　This　paper　describes　the　structure　and　manufacturing　process　of　the　tester.　It　is　found　in　scanning　electron　microscope　(SEM)　picture　of　the　tester　that　there　is　line　width　loss　during　the　etching　process,　which　had　an　important　influence　on　test　results.　The　test　results　show　that　the　tester　successfully　achieves　quality　inspection　of　the　micro-beam,　and　achieves　accurate　detection　and　extraction　of　static　tensile　fracture　strength　and　impact　bending　fracture　strength.　©　2018　IEEE.