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author:

Wang, Xin (Wang, Xin.) [1] | Tang, Dian (Tang, Dian.) [2] | Zhou, Jing En (Zhou, Jing En.) [3]

Indexed by:

EI

Abstract:

Sn is one of the most important elements for the Cl2-evolving anode coatings, but it always used as a minor additive. In this paper, an Sn-based ternary oxide coating with its composition of SnO2-23wt%TiO2-21wt%RuO2 was prepared by a sol-gel technique through etching, painting, sintering and annealing. The differential thermal analysis (DTA) shows that the crystallization behavior of the ternary xerogel is more similar to that of pure xerogels SnO2. X-rays diffraction (XRD) indicates that the coating is composed of rutile phase (Sn,Ti,Ru)O2. Any other undesired phases, for example, anatase TiO2 and metallic ruthenium phases are not found in the coatings. The microstructure and the morphologies were studied by a transmission electron microscope (TEM) and a scanning electron microscope (SEM). The results of energy dispersive spectrometer (EDS) indicate Sn content in the coatings remain at high level and coincident with the nominal composition. The grain sizes in the coatings are around 4 nm. The voltage of Cl2-evolution and O2-evolution shows the ternary coating has good electrochemical properties. © (2006) Trans Tech Publications, Switzerland.

Keyword:

Anodes Crystallization Differential thermal analysis Etching Nanostructures Oxide minerals Protective coatings Ruthenium compounds Scanning electron microscopy Sintering Sol-gel process Sol-gels Spectrometers Titanium Titanium dioxide Transmission electron microscopy Xerogels

Community:

  • [ 1 ] [Wang, Xin]State Laboratory for Mechanical Behavior of Materials, Department of Material Science and Engineering, Xi’an Jiaotong University, Xi’an; 710049, China
  • [ 2 ] [Tang, Dian]Institute for Materials Research, Fuzhou University, Fuzhou; 350002, China
  • [ 3 ] [Zhou, Jing En]Institute for Materials Research, Fuzhou University, Fuzhou; 350002, China

Reprint 's Address:

  • [tang, dian]institute for materials research, fuzhou university, fuzhou; 350002, china

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Source :

Solid State Phenomena

ISSN: 1012-0394

Year: 2006

Volume: 118

Page: 603-608

0 . 4 9 3

JCR@2005

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 2

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