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author:

Chen, Nan (Chen, Nan.) [1] (Scholars:陈楠)

Indexed by:

EI Scopus PKU CSCD

Abstract:

This study investigated the variation of profile curvature accuracy with the change of DEM resolution, and proposed the index of profile curvature accuracy on the basis of the concept of mutual information. Five major areas which represent different geomorphology were chosen as the sample areas, and DEMs with resolutions at 5, 15, 25, 35, 45, 55, 65, and 75 m were established in terms of the map scaled 1:104. The profile curvature derived from DEM at 5 m was assumed as the true value to examin the variation rules of the profile curvature derived from different resolutions of DEMs. The study results show that there exist power functions between RMSE (root mean square error) and the index, and that the exponential functions exist between the index and the resolutions of DEM. Besides, the computational formula for the resolutions of DEM is obtained in the use of the index. This formula can provide the basis for reducing data size and cost as well as for choosing proper resolutions of DEM under the condition of guaranteeing pre-determined accuracy of profile curvature.

Keyword:

Errors Exponential functions Mean square error Optical resolving power

Community:

  • [ 1 ] [Chen, Nan]Spatial Information Research Center, Key Lab. for Spatial Data Mining and Information Sharing of Ministry, Fuzhou University, Fuzhou, Fujian 350002, China

Reprint 's Address:

  • 陈楠

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Source :

Journal of China University of Mining and Technology

ISSN: 1000-1964

CN: 32-1152/TD

Year: 2013

Issue: 1

Volume: 42

Page: 147-151

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

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