• Complex
  • Title
  • Keyword
  • Abstract
  • Scholars
  • Journal
  • ISSN
  • Conference
成果搜索

author:

Jiang, Xiubo (Jiang, Xiubo.) [1] (Scholars:江修波) | Fang, Luebin (Fang, Luebin.) [2] | Zhang, Tao (Zhang, Tao.) [3]

Indexed by:

CPCI-S

Abstract:

Return voltage measurement (RVM) is an effective dielectric response test method and has been used to evaluate aging status of solid insulation. In the process of field test, the polarization spectrum obtained is non-standard which is affected by many factors, and the insulation status of dielectric is hard to judge. Factors that affect field test return voltage polarization spectrum were analyzed, method of judging and explaining the non-standard polarization spectrum was provided. Reliability and preciseness of judging solid insulation status with polarization spectrum were improved. This method have great reference value in engineering practice.

Keyword:

non-standard polarization spectrum residual charge return voltage Transformer

Community:

  • [ 1 ] [Jiang, Xiubo]Fuzhou Univ, Coll Elect Engn & Automat, Fuzhou 350002, Peoples R China
  • [ 2 ] [Fang, Luebin]Fuzhou Univ, Coll Elect Engn & Automat, Fuzhou 350002, Peoples R China
  • [ 3 ] [Zhang, Tao]China Three Gorges Univ, Electr Engn & Renewable Energy Sch, Yichang 443002, Peoples R China

Reprint 's Address:

  • 江修波

    [Jiang, Xiubo]Fuzhou Univ, Coll Elect Engn & Automat, Fuzhou 350002, Peoples R China

Show more details

Related Keywords:

Related Article:

Source :

APPLIED INFORMATICS AND COMMUNICATION, PT 4

ISSN: 1865-0929

Year: 2011

Volume: 227

Page: 246-,

Language: English

Cited Count:

WoS CC Cited Count: 1

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

Online/Total:105/10066770
Address:FZU Library(No.2 Xuyuan Road, Fuzhou, Fujian, PRC Post Code:350116) Contact Us:0591-22865326
Copyright:FZU Library Technical Support:Beijing Aegean Software Co., Ltd. 闽ICP备05005463号-1