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author:

Huang, QM (Huang, QM.) [1] (Scholars:黄清明) | Yu, JC (Yu, JC.) [2] (Scholars:俞建长) | Wang, YM (Wang, YM.) [3] | Wu, WG (Wu, WG.) [4]

Indexed by:

SCIE PKU CSCD

Abstract:

Standard mica was used to correct the X-ray powder diffraction instrument error and mathematic methods were employed to find the correction equation. By analyzing mullite sample and comparing the corrected and uncorrected analysis results we found the former is obviously more reasonable. So the conclusion is that the X-ray powder diffraction instrument error greatly affects the crystalline structure analysis, and the above method is convenient and effective for the correction of instrument error.

Keyword:

instrument error polycrystalline diffraction structure analysis

Community:

  • [ 1 ] Fuzhou Univ, Instrumentat Anal & Measurement Ctr, Fuzhou 350002, Fujiang, Peoples R China

Reprint 's Address:

  • 黄清明

    [Huang, QM]Fuzhou Univ, Instrumentat Anal & Measurement Ctr, Fuzhou 350002, Fujiang, Peoples R China

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Source :

CHINESE JOURNAL OF STRUCTURAL CHEMISTRY

ISSN: 0254-5861

CN: 35-1112/TQ

Year: 2005

Issue: 6

Volume: 24

Page: 691-695

0 . 6 6 9

JCR@2005

5 . 9 0 0

JCR@2023

ESI Discipline: CHEMISTRY;

JCR Journal Grade:3

Cited Count:

WoS CC Cited Count: 2

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 1

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