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author:

Huang, Q.-M. (Huang, Q.-M..) [1] (Scholars:黄清明) | Yu, J.-C. (Yu, J.-C..) [2] (Scholars:俞建长) | Wang, Y.-M. (Wang, Y.-M..) [3] | Wu, W.-G. (Wu, W.-G..) [4]

Indexed by:

Scopus PKU CSCD

Abstract:

Standard mica was used to correct the X-ray powder diffraction instrument error and mathematic methods were employed to find the correction equation. By analyzing mullite sample and comparing the corrected and uncorrected analysis results we found the former is obviously more reasonable. So the conclusion is that the X-ray powder diffraction instrument error greatly affects the crystalline structure analysis, and the above method is convenient and effective for the correction of instrument error.

Keyword:

Instrument error; Polycrystalline diffraction; Structure analysis

Community:

  • [ 1 ] [Huang, Q.-M.]Instrumentation Analysis and Measurement, Center of Fuzhou University, Fuzhou, Fujiang 350002, China
  • [ 2 ] [Yu, J.-C.]Instrumentation Analysis and Measurement, Center of Fuzhou University, Fuzhou, Fujiang 350002, China
  • [ 3 ] [Wang, Y.-M.]Instrumentation Analysis and Measurement, Center of Fuzhou University, Fuzhou, Fujiang 350002, China
  • [ 4 ] [Wu, W.-G.]Instrumentation Analysis and Measurement, Center of Fuzhou University, Fuzhou, Fujiang 350002, China

Reprint 's Address:

  • 黄清明

    [Huang, Q.-M.]Instrumentation Analysis and Measurement, Center of Fuzhou University, Fuzhou, Fujiang 350002, China

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Source :

Jiegou Huaxue

ISSN: 0254-5861

CN: 35-1112/TQ

Year: 2005

Issue: 6

Volume: 24

Page: 691-695

0 . 6 6 9

JCR@2005

5 . 9 0 0

JCR@2023

ESI Discipline: CHEMISTRY;

JCR Journal Grade:3

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

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