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author:

Ye, Y. (Ye, Y..) [1] (Scholars:叶芸) | Guo, T. L. (Guo, T. L..) [2] (Scholars:郭太良)

Indexed by:

EI Scopus SCIE

Abstract:

This research study investigates the hole metallisation processes of the microwave printed circuit board. During the study, the poly(tetrafluoroethylene) (PTFE) wall of the holes was modified by sodium naphthalene solution. Owing to the disruption of the C-F bond by the sodium atoms on the PTFE surface transforming C- dangling bonds, the surface energy of the PTFE increased from about 20 to 60-70 mN cm(-1). The study employed XPS analysis to examine the modification mechanism. The results of the authors' study show peel strength of similar to 2.03 N cm(-1) between the copper layer and the sample treated with sodium naphthalene solution within the time range of 20-30 s.

Keyword:

Hole metallisation Modification Peel strength Sodium naphthalene solution XPS

Community:

  • [ 1 ] [Ye, Y.]Fuzhou Univ, Coll Phys & Informat Engn, Fuzhou 350002, Peoples R China
  • [ 2 ] [Guo, T. L.]Fuzhou Univ, Coll Phys & Informat Engn, Fuzhou 350002, Peoples R China

Reprint 's Address:

  • 叶芸

    [Ye, Y.]Fuzhou Univ, Coll Phys & Informat Engn, Fuzhou 350002, Peoples R China

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Source :

TRANSACTIONS OF THE INSTITUTE OF METAL FINISHING

ISSN: 0020-2967

Year: 2009

Issue: 4

Volume: 87

Page: 217-220

1 . 3 7 6

JCR@2009

1 . 2 0 0

JCR@2023

ESI Discipline: MATERIALS SCIENCE;

JCR Journal Grade:1

CAS Journal Grade:1

Cited Count:

WoS CC Cited Count: 3

SCOPUS Cited Count: 5

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

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