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author:

Yang XiaoXiang (Yang XiaoXiang.) [1] | Fu MingWang (Fu MingWang.) [2] | Wang XiuRong (Wang XiuRong.) [3] | Liu XiaoYing (Liu XiaoYing.) [4]

Indexed by:

EI Scopus SCIE

Abstract:

This paper presents the characteristics of the crack growth at the interface of rubber-rubber and rubber-steel bimaterials under tensile deformation using the non-linear finite element method. By using the commercial finite element software ABAQUS, the J integral calculations are carried out for the initial interface crack in the interfaces in-between two Neo-Hookean materials, two Mooney-Rivlin materials, Neo-Hookean and Mooney-Rivlin rubbers, Neo-Hookean and Polynomial, Mooney-Rivlin and Polynomial, and the Mooney-Rivlin and steel bi-materials. The computational results of the maximum J integral direction around the crack tip illustrate the possible direction of crack growth initiation. Furthermore, it is found that the crack bends to the softer rubber material at a certain angle with the initial crack direction if the crack depth is relatively small. For the crack with a larger depth, the crack propagates to grow along the interface in-between the bimaterials.

Keyword:

bimaterials crack growth interface crack J integral non-linear finite element method rubber-like materials

Community:

  • [ 1 ] [Yang XiaoXiang]Fuzhou Univ, Sch Mech Engn & Automat, Fuzhou 350108, Peoples R China
  • [ 2 ] [Wang XiuRong]Fuzhou Univ, Sch Mech Engn & Automat, Fuzhou 350108, Peoples R China
  • [ 3 ] [Liu XiaoYing]Fuzhou Univ, Sch Mech Engn & Automat, Fuzhou 350108, Peoples R China
  • [ 4 ] [Fu MingWang]Hong Kong Polytech Univ, Dept Mech Engn, Kowloon, Hong Kong, Peoples R China

Reprint 's Address:

  • 杨晓翔

    [Yang XiaoXiang]Fuzhou Univ, Sch Mech Engn & Automat, Fuzhou 350108, Peoples R China

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Source :

SCIENCE CHINA-PHYSICS MECHANICS & ASTRONOMY

ISSN: 1674-7348

CN: 11-5849/N

Year: 2011

Issue: 10

Volume: 54

Page: 1866-1874

0 . 7 7 9

JCR@2011

6 . 4 0 0

JCR@2023

ESI Discipline: PHYSICS;

JCR Journal Grade:3

CAS Journal Grade:4

Cited Count:

WoS CC Cited Count: 3

SCOPUS Cited Count: 4

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

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