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author:

Xiang, Y.X. (Xiang, Y.X..) [1] | Wang, F.M. (Wang, F.M..) [2] | Rong, W.X. (Rong, W.X..) [3] | Ying, L.X. (Ying, L.X..) [4]

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Scopus

Abstract:

This paper presents the characteristics of the crack growth at the interface of rubber-rubber and rubber-steel bimaterials under tensile deformation using the non-linear finite element method. By using the commercial finite element software ABAQUS, the J integral calculations are carried out for the initial interface crack in the interfaces in-between two Neo-Hookean materials, two Mooney-Rivlin materials, Neo-Hookean and Mooney-Rivlin rubbers, Neo-Hookean and Polynomial, Mooney-Rivlin and Polynomial, and the Mooney-Rivlin and steel bi-materials. The computational results of the maximum J integral direction around the crack tip illustrate the possible direction of crack growth initiation. Furthermore, it is found that the crack bends to the softer rubber material at a certain angle with the initial crack direction if the crack depth is relatively small. For the crack with a larger depth, the crack propagates to grow along the interface in-between the bimaterials. © Science China Press and Springer-Verlag Berlin Heidelberg 2011.

Keyword:

Community:

  • [ 1 ] [Xiang, Y.X.]School of Mechanical Engineering and Automation, Fuzhou University, Fuzhou 350108, China
  • [ 2 ] [Wang, F.M.]Department of Mechanical Engineering, Hong Kong Polytechnic University, Hung-Hom-Kowloon, Hong Kong
  • [ 3 ] [Rong, W.X.]School of Mechanical Engineering and Automation, Fuzhou University, Fuzhou 350108, China
  • [ 4 ] [Ying, L.X.]School of Mechanical Engineering and Automation, Fuzhou University, Fuzhou 350108, China

Reprint 's Address:

  • [Xiang, Y.X.]School of Mechanical Engineering and Automation, Fuzhou University, Fuzhou 350108, China

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Source :

Science China: Physics, Mechanics and Astronomy

ISSN: 1674-7348

Year: 2011

Issue: 10

Volume: 54

Page: 1866-1874

0 . 7 7 9

JCR@2011

6 . 4 0 0

JCR@2023

JCR Journal Grade:3

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count: 4

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

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