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author:

Zhong, Jianfeng (Zhong, Jianfeng.) [1] (Scholars:钟剑锋) | Zhong, Shuncong (Zhong, Shuncong.) [2] (Scholars:钟舜聪) | Zhang, Qiukun (Zhang, Qiukun.) [3] (Scholars:张秋坤) | Zhuang, Yizhou (Zhuang, Yizhou.) [4] | Lu, Huancai (Lu, Huancai.) [5] | Fu, Xinbin (Fu, Xinbin.) [6]

Indexed by:

EI Scopus SCIE

Abstract:

A non-projection fringe vision measurement system suitable for vibration monitoring was proposed by using the concept of a 2D optical coherence vibration tomography (2D-OCVT) technique. An artificial quasi-interferogram fringe pattern (QIFP), similar to the interferogram of the 2D-OCVT system, was pasted onto the surface of a vibrating structure as a sensor. Image sequences of the QIFP were captured by a high-speed CMOS camera that worked as a detector. It was possible to obtain both the in-plane and out-of-plane vibration simultaneously. The in-plane vibration was obtained by tracking the center of the imaged QIFP using an image cross-correlation method, whilst the out-of-plane vibration was obtained from the changes in period density of the imaged QIFP. The influence of the noise sources from the CMOS image sensor, together with the effect of the imaging distance, the period density of the QIFP and also the key parameters of the fringe density enhanced by the spectrum correction method on the accuracy of the displacement measurement, were investigated by numerical simulations and experiments. Compared with the results from a conventional accelerometer-based measurement system, the proposed method was demonstrated to be an effective and accurate technique for measuring structural vibration without introducing any extra mass from the accelerometer. The significant advantages of this method include its simple installation and real-time dynamic response measurement capability, making the measurement system ideal for the low-and high-frequency vibration monitoring of engineering structures.

Keyword:

CMOS image sensor non-projection artificial fringe vision measurement quasi-interferogram fringe pattern spectrum correction vibration monitoring

Community:

  • [ 1 ] [Zhong, Jianfeng]Fuzhou Univ, Sch Mech Engn & Automat, Lab Opt Terahertz & Nondestruct Testing, Fuzhou 350108, Peoples R China
  • [ 2 ] [Zhong, Shuncong]Fuzhou Univ, Sch Mech Engn & Automat, Lab Opt Terahertz & Nondestruct Testing, Fuzhou 350108, Peoples R China
  • [ 3 ] [Zhang, Qiukun]Fuzhou Univ, Sch Mech Engn & Automat, Lab Opt Terahertz & Nondestruct Testing, Fuzhou 350108, Peoples R China
  • [ 4 ] [Lu, Huancai]Fuzhou Univ, Sch Mech Engn & Automat, Lab Opt Terahertz & Nondestruct Testing, Fuzhou 350108, Peoples R China
  • [ 5 ] [Zhuang, Yizhou]Zhejiang Univ Technol, Coll Civil Engn & Architecture, Hangzhou 310014, Zhejiang, Peoples R China
  • [ 6 ] [Lu, Huancai]Zhejiang Univ Technol, Coll Mech Engn, Hangzhou 310014, Zhejiang, Peoples R China
  • [ 7 ] [Fu, Xinbin]Xiamen Special Equipment Inspect Inst, Xiamen 361000, Peoples R China

Reprint 's Address:

  • 钟舜聪

    [Zhong, Shuncong]Fuzhou Univ, Sch Mech Engn & Automat, Lab Opt Terahertz & Nondestruct Testing, Fuzhou 350108, Peoples R China

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Source :

MEASUREMENT SCIENCE AND TECHNOLOGY

ISSN: 0957-0233

Year: 2017

Issue: 1

Volume: 28

1 . 6 8 5

JCR@2017

2 . 7 0 0

JCR@2023

ESI Discipline: ENGINEERING;

ESI HC Threshold:177

JCR Journal Grade:2

CAS Journal Grade:3

Cited Count:

WoS CC Cited Count: 13

SCOPUS Cited Count: 20

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

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