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author:

Huang, Yi (Huang, Yi.) [1] (Scholars:黄异) | Zhong, Shuncong (Zhong, Shuncong.) [2] (Scholars:钟舜聪) | Shen, Yaochun (Shen, Yaochun.) [3] | Yao, Ligang (Yao, Ligang.) [4] (Scholars:姚立纲) | Yu, Yingjie (Yu, Yingjie.) [5] | Cui, Daxiang (Cui, Daxiang.) [6]

Indexed by:

EI Scopus SCIE

Abstract:

We proposed a terahertz (THz) surface plasmon resonance (SPR) sensor with Kretschmann coupling configuration with buffer layer covered substrate containing doped monolayer graphene (MLG) directly deposited onto the coupling prism. The performance of the SPR sensor in terms of detection accuracy, sensitivity and figure of merit (FOM) were investigated by applying angular interrogation technique. The results demonstrated that the prism/substrate/graphene coupling structure has higher detection accuracy after coating a low-permittivity buffer layer underneath graphene. Moreover, the sensitivity of sensor could be enhanced using larger refractive index substrate. Furthermore, this proposed structure could effectively overcome the challenge that sample preparation with a small thickness needs to be maintained in Otto geometry based sensor. The results showed the maximum sensitivity of the THz plasmonic sensor up to 49.5 deg/RIU along with a FOM of 8.76 RIU-1. The prominent characteristics of the proposed structure would pave the way for high-performance THz plasmonic sensors.

Keyword:

Graphene Kretschmann coupling configuration Plasmonic Sensor Terahertz

Community:

  • [ 1 ] [Huang, Yi]Fuzhou Univ, Sch Mech Engn & Automat, Lab Opt Terahertz & Nondestruct Testing, Fuzhou 350108, Peoples R China
  • [ 2 ] [Zhong, Shuncong]Fuzhou Univ, Sch Mech Engn & Automat, Lab Opt Terahertz & Nondestruct Testing, Fuzhou 350108, Peoples R China
  • [ 3 ] [Shen, Yaochun]Fuzhou Univ, Sch Mech Engn & Automat, Lab Opt Terahertz & Nondestruct Testing, Fuzhou 350108, Peoples R China
  • [ 4 ] [Yao, Ligang]Fuzhou Univ, Sch Mech Engn & Automat, Lab Opt Terahertz & Nondestruct Testing, Fuzhou 350108, Peoples R China
  • [ 5 ] [Zhong, Shuncong]Shanghai Univ, Dept Precis Mech Engn, Shanghai 200444, Peoples R China
  • [ 6 ] [Yu, Yingjie]Shanghai Univ, Dept Precis Mech Engn, Shanghai 200444, Peoples R China
  • [ 7 ] [Shen, Yaochun]Univ Liverpool, Dept Elect Engn & Elect, Liverpool L69 3BX, Merseyside, England
  • [ 8 ] [Cui, Daxiang]Shanghai Jiao Tong Univ, Dept Bionano Sci & Engn, Shanghai 200030, Peoples R China

Reprint 's Address:

  • 钟舜聪

    [Zhong, Shuncong]Fuzhou Univ, Sch Mech Engn & Automat, Lab Opt Terahertz & Nondestruct Testing, Fuzhou 350108, Peoples R China

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Source :

IEEE PHOTONICS JOURNAL

ISSN: 1943-0655

Year: 2017

Issue: 6

Volume: 9

2 . 6 2 7

JCR@2017

2 . 1 0 0

JCR@2023

ESI Discipline: PHYSICS;

ESI HC Threshold:170

JCR Journal Grade:2

CAS Journal Grade:3

Cited Count:

WoS CC Cited Count: 14

SCOPUS Cited Count: 23

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 2

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