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author:

Deng, Liping (Deng, Liping.) [1] (Scholars:邓丽萍) | Liu, Zhifeng (Liu, Zhifeng.) [2] | Wang, Bingshu (Wang, Bingshu.) [3] (Scholars:汪炳叔) | Han, Ke (Han, Ke.) [4] | Xiang, Hongliang (Xiang, Hongliang.) [5] (Scholars:向红亮)

Indexed by:

EI Scopus SCIE

Abstract:

Cu-Nb microcomposite wires drawn to different strain values were studied by means of scanning electron microscopy and transmission electron microscopy. The Cu and Nb near the interfaces show a typical Kurdjumov-Sachs relationship with a deviation angle of 12 degrees. This deviation accommodates internal stresses and slip discontinuity between Cu and Nb. The dislocations are mainly stored around the interface near the Cu matrix. Lattice distortion occurred near the interfaces, where Nb is believed to mix into Cu matrix. Microhardness is affected by interface area density as well as by strain-induced lattice distortion, which can produce a supersaturated solid solution.

Keyword:

Cu-Nb microcomposite wires Interface Microhardness Solid solution

Community:

  • [ 1 ] [Deng, Liping]Fuzhou Univ, Sch Mech Engn & Automat, Fuzhou 350116, Fujian, Peoples R China
  • [ 2 ] [Liu, Zhifeng]Fuzhou Univ, Sch Mech Engn & Automat, Fuzhou 350116, Fujian, Peoples R China
  • [ 3 ] [Xiang, Hongliang]Fuzhou Univ, Sch Mech Engn & Automat, Fuzhou 350116, Fujian, Peoples R China
  • [ 4 ] [Wang, Bingshu]Fuzhou Univ, Coll Mat Sci & Engn, Fuzhou 350116, Fujian, Peoples R China
  • [ 5 ] [Han, Ke]Natl High Magnet Field Lab, Tallahassee, FL 32310 USA

Reprint 's Address:

  • 邓丽萍 向红亮

    [Deng, Liping]Fuzhou Univ, Sch Mech Engn & Automat, Fuzhou 350116, Fujian, Peoples R China;;[Xiang, Hongliang]Fuzhou Univ, Sch Mech Engn & Automat, Fuzhou 350116, Fujian, Peoples R China

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Source :

MATERIALS CHARACTERIZATION

ISSN: 1044-5803

Year: 2019

Volume: 150

Page: 62-66

3 . 5 6 2

JCR@2019

4 . 8 0 0

JCR@2023

ESI Discipline: MATERIALS SCIENCE;

ESI HC Threshold:236

JCR Journal Grade:2

CAS Journal Grade:2

Cited Count:

WoS CC Cited Count: 24

SCOPUS Cited Count: 28

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

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