• Complex
  • Title
  • Keyword
  • Abstract
  • Scholars
  • Journal
  • ISSN
  • Conference
成果搜索
High Impact Results & Cited Count Trend for Year Keyword Cloud and Partner Relationship

Query:

学者姓名:林杰文

Refining:

Type

Submit Unfold

Former Name

Submit

Language

Submit

Clean All

Sort by:
Default
  • Default
  • Title
  • Year
  • WOS Cited Count
  • Impact factor
  • Ascending
  • Descending
< Page ,Total 2 >
Novel rotational speed measuring method based on micro-indentation-shaft detected by optical coherent system SCIE
期刊论文 | 2025 , 184 | OPTICS AND LASERS IN ENGINEERING
Abstract&Keyword Cite Version(2)

Abstract :

Accurate rotational speed measurement is a prerequisite for realizing the condition monitoring and fault diagnosis of rotating equipment. This study proposes a novel rotational speed measurement method based on optical coherent displacement measurement. An optical coherence system is used to measure the relative depth of the shaft surface with uniformly etched micro-indentations on the circumferential surface. Fast Fourier transform (FFT) and the Hanning window energy centrobaric method (HnWECM) are used to process the collected photoelectric signals to obtain depth information and thereby realize the measurement of surface microindentations. During the operation, the rotational speed of the shaft is obtained by calculating the ratio of the angular difference between the relative depth of the rectangular pulses of the surface and the time interval. The experimental validation of the response is performed. The experimental results show that in the range of 0 rpm to 60 rpm, the indication error is <1 %, the nonlinearity error is <0.3584 %, and the repeatability error is <0.28 %. In the range of 0 rpm to 600 rpm, the rotational speed measurement method performed well with an indication error of <0.5 %, a maximum nonlinear error of 0.22 %, and a repeatability error of no >0.28 %. Compared with the results reported in existing literature, the proposed method offers advantages in terms of accuracy, linearity, and repeatability.

Keyword :

FFT FFT Hanning window Hanning window Micro-indentation Micro-indentation Optical measurement Optical measurement Rotational speed measurement Rotational speed measurement

Cite:

Copy from the list or Export to your reference management。

GB/T 7714 Liang, Wei , Hong, Xiaodong , Huang, Dichang et al. Novel rotational speed measuring method based on micro-indentation-shaft detected by optical coherent system [J]. | OPTICS AND LASERS IN ENGINEERING , 2025 , 184 .
MLA Liang, Wei et al. "Novel rotational speed measuring method based on micro-indentation-shaft detected by optical coherent system" . | OPTICS AND LASERS IN ENGINEERING 184 (2025) .
APA Liang, Wei , Hong, Xiaodong , Huang, Dichang , Chen, Linnan , Zhong, Jianfeng , Zhang, Qiukun et al. Novel rotational speed measuring method based on micro-indentation-shaft detected by optical coherent system . | OPTICS AND LASERS IN ENGINEERING , 2025 , 184 .
Export to NoteExpress RIS BibTex

Version :

Novel rotational speed measuring method based on micro-indentation-shaft detected by optical coherent system EI
期刊论文 | 2025 , 184 | Optics and Lasers in Engineering
Novel rotational speed measuring method based on micro-indentation-shaft detected by optical coherent system Scopus
期刊论文 | 2025 , 184 | Optics and Lasers in Engineering
Hierarchical MoS2/Poly(ionic liquid) Metamaterials for Electrically Tunable Terahertz Stealth SCIE
期刊论文 | 2025 , 37 (37) | ADVANCED MATERIALS
Abstract&Keyword Cite Version(2)

Abstract :

Active absorption modulation is critical for advanced stealth technologies, especially given the emerging detection threat from terahertz atmospheric windows. However, due to the difficulty in balancing high absorption and tunability, the actual manufacturing of most terahertz absorbers usually neglects the integration of electrical tuning, which limits their development of dynamic wave trapping for electronic countermeasure systems. Here, a terahertz stealth metamaterial (TSM) with hierarchical ionotronic architecture is proposed to overcome the tradeoff. Large-area continuous MoS2 assemblies tightly attached poly(ionic liquid) (PIL) microarrays provide enough conditions for surface electron conduction and plasmon mode excitation. By establishing wave-electron-ion interaction pathways, the directional migration of free anions inside the PIL and the accumulation of excess charge carriers up to 100.4% at the MoS2 interfaces are promoted, thereby stimulating changes in the plasma frequency of the absorption system. Consequently, this micro-nano structural design enhances the absorption tunability and combines multiple dissipative behaviors. TSM exhibit high specific attenuation (-275 dB mm(-1)), frequency agility (21.4%), and phase switching (153.1 deg.) within terahertz atmospheric windows. Moreover, the template-assisted assembly strategy adopted has the potential to be used for the building of universal blocks operating within other frequency ranges.

Keyword :

electric tuning electric tuning metamaterial metamaterial MoS2 MoS2 poly(ionic liquid) poly(ionic liquid) terahertz stealth terahertz stealth

Cite:

Copy from the list or Export to your reference management。

GB/T 7714 Zhong, Yujie , Sun, Fuwei , Zhong, Shuncong et al. Hierarchical MoS2/Poly(ionic liquid) Metamaterials for Electrically Tunable Terahertz Stealth [J]. | ADVANCED MATERIALS , 2025 , 37 (37) .
MLA Zhong, Yujie et al. "Hierarchical MoS2/Poly(ionic liquid) Metamaterials for Electrically Tunable Terahertz Stealth" . | ADVANCED MATERIALS 37 . 37 (2025) .
APA Zhong, Yujie , Sun, Fuwei , Zhong, Shuncong , Huang, Yi , Lin, Jiewen , Zhang, Qiukun et al. Hierarchical MoS2/Poly(ionic liquid) Metamaterials for Electrically Tunable Terahertz Stealth . | ADVANCED MATERIALS , 2025 , 37 (37) .
Export to NoteExpress RIS BibTex

Version :

Hierarchical MoS2/Poly(ionic liquid) Metamaterials for Electrically Tunable Terahertz Stealth Scopus
期刊论文 | 2025 | Advanced Materials
Wavenumber calibration and dispersion compensation for Fourier domain optical coherence tomography by parameterized instantaneous frequency estimation method SCIE
期刊论文 | 2024 , 174 | OPTICS AND LASER TECHNOLOGY
Abstract&Keyword Cite Version(2)

Abstract :

A nonlinear chirp is always introduced to an interference fringe in the Fourier domain optical coherence tomography (FD-OCT), which can be regarded as an amplitude-modulated and frequency-modulated nonstationary signal. It is mainly caused by the non-uniform wavenumber sampling and the dispersion mismatch between the sample and the reference arms. It results in the broadening of the axial point spread function and the degradation of the axial resolution. In this paper, the parameterized instantaneous frequency estimation method (PIFEM) is applied to estimate the phase function of the chirped interference fringe to achieve the linear resampling of the wavenumber space and the rebalance of the dispersion mismatch. The proposed method is efficient and convenient that requires only two interference fringes corresponding to a mirror at different depths in the sample arm of the FD-OCT system. In addition, it is proved that the PIFEM is adapted to compensate for the depthindependent dispersion mismatch caused by the sample comprised of layered structures. The experiment results validate the performance of the proposed method.

Keyword :

Dispersion compensation Dispersion compensation estimation estimation Optical coherence tomography Optical coherence tomography Parameterized instantaneous frequency Parameterized instantaneous frequency Wavenumber calibration Wavenumber calibration

Cite:

Copy from the list or Export to your reference management。

GB/T 7714 Huang, Yuexin , Deng, Yaosen , Lin, Jiewen et al. Wavenumber calibration and dispersion compensation for Fourier domain optical coherence tomography by parameterized instantaneous frequency estimation method [J]. | OPTICS AND LASER TECHNOLOGY , 2024 , 174 .
MLA Huang, Yuexin et al. "Wavenumber calibration and dispersion compensation for Fourier domain optical coherence tomography by parameterized instantaneous frequency estimation method" . | OPTICS AND LASER TECHNOLOGY 174 (2024) .
APA Huang, Yuexin , Deng, Yaosen , Lin, Jiewen , Zhang, Qiukun , Zhong, Shuncong . Wavenumber calibration and dispersion compensation for Fourier domain optical coherence tomography by parameterized instantaneous frequency estimation method . | OPTICS AND LASER TECHNOLOGY , 2024 , 174 .
Export to NoteExpress RIS BibTex

Version :

Wavenumber calibration and dispersion compensation for Fourier domain optical coherence tomography by parameterized instantaneous frequency estimation method EI
期刊论文 | 2024 , 174 | Optics and Laser Technology
Wavenumber calibration and dispersion compensation for Fourier domain optical coherence tomography by parameterized instantaneous frequency estimation method Scopus
期刊论文 | 2024 , 174 | Optics and Laser Technology
Nanoscale surface roughness measurement based on frequency-domain interferometry principle SCIE
期刊论文 | 2024 , 178 | OPTICS AND LASERS IN ENGINEERING
Abstract&Keyword Cite Version(2)

Abstract :

To accurately measure the surface roughness of precision parts, this paper proposes a non-destructive measurement method of surface roughness using frequency-domain interferometry as the core detection principle and the Hanning window energy center method as the signal demodulation method. The corresponding relationship between the height changes of the sample surface profile and the frequency density changes in the interference signal was established, and the Hanning window energy center method was used to accurately extract the periodic frequency, which can more accurately measure the surface roughness of the sample. After the spectrum correction method, the peak signal-to-noise ratio of the system reaches 50 similar to 60 dB. When the signal-tonoise ratio is 54.8, the theoretical measurement accuracy of the system reaches 5 nm. The vibration error generated during the actual measurement process is only 20 nm. The measurement results of the roughness measuring instrument were compared and analyzed. The experimental results showed that this system has higher measurement accuracy and accuracy, and the maximum repeatability error is 7 nm. To further verify the accuracy of the system, an atomic force microscope was used for comparison and verification. The difference between the two measurement results was 12 nm. This work provides a faster and more accurate non-destructive measurement method for surface roughness measurement.

Keyword :

Frequency-domain interferometry Frequency-domain interferometry Hanning window energy center method Hanning window energy center method Surface roughness Surface roughness

Cite:

Copy from the list or Export to your reference management。

GB/T 7714 Zhang, Qiukun , Wang, Wenxuan , Zhong, Jialu et al. Nanoscale surface roughness measurement based on frequency-domain interferometry principle [J]. | OPTICS AND LASERS IN ENGINEERING , 2024 , 178 .
MLA Zhang, Qiukun et al. "Nanoscale surface roughness measurement based on frequency-domain interferometry principle" . | OPTICS AND LASERS IN ENGINEERING 178 (2024) .
APA Zhang, Qiukun , Wang, Wenxuan , Zhong, Jialu , Lin, Jiewen , Chen, Jinguo , Luo, Manting et al. Nanoscale surface roughness measurement based on frequency-domain interferometry principle . | OPTICS AND LASERS IN ENGINEERING , 2024 , 178 .
Export to NoteExpress RIS BibTex

Version :

Nanoscale surface roughness measurement based on frequency-domain interferometry principle EI
期刊论文 | 2024 , 178 | Optics and Lasers in Engineering
Nanoscale surface roughness measurement based on frequency-domain interferometry principle Scopus
期刊论文 | 2024 , 178 | Optics and Lasers in Engineering
High-Precision Semiconductor Substrate Thickness Gauge Based on Spectral-Domain Interferometry SCIE
期刊论文 | 2024 , 11 (5) | PHOTONICS
WoS CC Cited Count: 1
Abstract&Keyword Cite Version(1)

Abstract :

The flatness of semiconductor substrates is an important parameter for evaluating the surface quality of semiconductor substrates. However, existing technology cannot simultaneously achieve high measurement efficiency, large-range thickness measurement, and nanometer-level measurement accuracy in the thickness measurement of semiconductor substrates. To solve the problems, we propose to apply the method that combines spectral-domain optical coherence tomography (SD-OCT) with the Hanning-windowed energy centrobaric method (HnWECM) to measure the thickness of semiconductor substrates. The method can be employed in the full-chip thickness measurement of a sapphire substrate, which has a millimeter measuring range, nanometer-level precision, and a sampling rate that can reach up to 80 kHz. In this contribution, we measured the full-chip thickness map of a sapphire substrate by using this method and analyzed the machining characteristics. The measurement results of a high-precision mechanical thickness gauge, which is widely used for thickness measurement in the wafer fabrication process, were compared with the proposed method. The difference between these two methods is 0.373%, which explains the accuracy of the applied method to some extent. The results of 10 sets of repeatability experiments on 250 measurement points show that the maximum relative standard deviation (RSD) at this point is 0.0061%, and the maximum fluctuation is 71.0 nm. The above experimental results prove that this method can achieve the high-precision thickness measurement of the sapphire substrate and is of great significance for improving the surface quality detection level of semiconductor substrates.

Keyword :

HnWECM HnWECM SD-OCT SD-OCT semiconductor substrate semiconductor substrate spectral-domain interferometry spectral-domain interferometry thickness measurement thickness measurement

Cite:

Copy from the list or Export to your reference management。

GB/T 7714 Zhong, Shuncong , He, Renyu , Deng, Yaosen et al. High-Precision Semiconductor Substrate Thickness Gauge Based on Spectral-Domain Interferometry [J]. | PHOTONICS , 2024 , 11 (5) .
MLA Zhong, Shuncong et al. "High-Precision Semiconductor Substrate Thickness Gauge Based on Spectral-Domain Interferometry" . | PHOTONICS 11 . 5 (2024) .
APA Zhong, Shuncong , He, Renyu , Deng, Yaosen , Lin, Jiewen , Zhang, Qiukun . High-Precision Semiconductor Substrate Thickness Gauge Based on Spectral-Domain Interferometry . | PHOTONICS , 2024 , 11 (5) .
Export to NoteExpress RIS BibTex

Version :

High-Precision Semiconductor Substrate Thickness Gauge Based on Spectral-Domain Interferometry Scopus
期刊论文 | 2024 , 11 (5) | Photonics
Three-dimensional micro-force measurement method based on broadband optical coherence SCIE
期刊论文 | 2024 , 234 | MEASUREMENT
WoS CC Cited Count: 3
Abstract&Keyword Cite Version(2)

Abstract :

In response to the high-precision and multi-dimensional force measurement requirements in the fields of biology and medicine, this paper proposes a novel three-dimensional microforce measurement method based on the broadband optical coherence. A novel, compact, and low-coupling elastic element was designed, with a maximum outer diameter of 26 mm and a capacity of 50 g in the X-, Y-, and Z-directions, respectively. The functional relationship between the displacements of the three detecting points on the elastic element and the applied external force was derived based on the elastic mechanics theory. And it was also verified by the finite element method. A self-built optics system was set up to sense the displacements of the three points on the elastic element. The experiments results showed that the resolution in the X-, Y-, and Z-directions was 0.10 mN, 0.11 mN and 0.13 mN, respectively. In the measuring range of (10-50) g, the maximum coupling rate was 4.55 %, and the maximum linear error was 4.70 %. The maximum repeatability error was only 0.615 %. The method and sensor were verified with good characteristics of high resolution, low coupling rate, high linearity and high accuracy, comparing to other reported researches. The multi-dimensional force measuring method could be used in the fields of biology and medicine.

Keyword :

Force measurement Force measurement Micro force Micro force Optical coherence Optical coherence Three-dimensional Three-dimensional

Cite:

Copy from the list or Export to your reference management。

GB/T 7714 Liang, Wei , Li, Xingqiang , Zhong, Shuncong et al. Three-dimensional micro-force measurement method based on broadband optical coherence [J]. | MEASUREMENT , 2024 , 234 .
MLA Liang, Wei et al. "Three-dimensional micro-force measurement method based on broadband optical coherence" . | MEASUREMENT 234 (2024) .
APA Liang, Wei , Li, Xingqiang , Zhong, Shuncong , Zhang, Qiukun , Lin, Jiewen . Three-dimensional micro-force measurement method based on broadband optical coherence . | MEASUREMENT , 2024 , 234 .
Export to NoteExpress RIS BibTex

Version :

Three-dimensional micro-force measurement method based on broadband optical coherence EI
期刊论文 | 2024 , 234 | Measurement: Journal of the International Measurement Confederation
Three-dimensional micro-force measurement method based on broadband optical coherence Scopus
期刊论文 | 2024 , 234 | Measurement: Journal of the International Measurement Confederation
基于莫尔条纹的全周转角精密测量方法 PKU
期刊论文 | 2024 , 45 (3) , 644-651 | 应用光学
Abstract&Keyword Cite Version(2)

Abstract :

由于将莫尔条纹图进行快速傅里叶变换时会导致频谱泄露,导致无法实现 360°的全周精确测量,因此提出基于莫尔条纹的全周转角测量方法并搭建转角测量系统.以 1°为步距,利用CMOS相机采集不同宽度的莫尔条纹图像,采用快速傅里叶变换(fast Fourier transform,FFT)对条纹进行处理,得到光栅频谱信息.同时采用汉宁窗能量重心校正算法(Hanning-window energy centrobaric method,HnWECM)校正频谱,得到莫尔条纹图像表征转角的真实有效信息,实现全周精确测量.实验结果表明,该系统可快速精准地实现转角的全周测量,测量范围广,最大误差率为0.2433%.

Keyword :

快速傅里叶变换 快速傅里叶变换 汉宁窗能量重心法 汉宁窗能量重心法 莫尔条纹 莫尔条纹 转角测量 转角测量

Cite:

Copy from the list or Export to your reference management。

GB/T 7714 许令鸿 , 张秋坤 , 林杰文 et al. 基于莫尔条纹的全周转角精密测量方法 [J]. | 应用光学 , 2024 , 45 (3) : 644-651 .
MLA 许令鸿 et al. "基于莫尔条纹的全周转角精密测量方法" . | 应用光学 45 . 3 (2024) : 644-651 .
APA 许令鸿 , 张秋坤 , 林杰文 , 李劲林 , 黎昕婷 , 钟舜聪 . 基于莫尔条纹的全周转角精密测量方法 . | 应用光学 , 2024 , 45 (3) , 644-651 .
Export to NoteExpress RIS BibTex

Version :

基于莫尔条纹的全周转角精密测量方法 Scopus PKU
期刊论文 | 2024 , 45 (3) , 644-651 | 应用光学
基于莫尔条纹的全周转角精密测量方法 PKU
期刊论文 | 2024 , 45 (03) , 644-651 | 应用光学
一种基于光学干涉的自润滑轴承涂层厚度检测装置 incoPat
专利 | 2022-07-12 00:00:00 | CN202221788563.8
Abstract&Keyword Cite

Abstract :

本实用新型涉及一种基于光学干涉的自润滑轴承涂层厚度检测装置,该装置包括:钨卤素灯光源模块,用于发射光束;第一凸透镜,用于将钨卤素灯光源模块的发射光准直为平行光束;迈克尔逊干涉仪模块,用于将光束分束为强度相等的两束光,作为参考光、探测光分别汇聚于参考镜、待测轴承涂层表面,反射后重合发生干涉,形成干涉光束;以及二维光谱仪模块,包括反射镜、反射式光栅、柱透镜和面阵CCD相机,干涉光束经反射镜传播至反射式光栅,并按波长在空间分光后由柱透镜汇聚成干涉谱线,由面阵CCD相机采集获得二维干涉光谱条纹。该装置有利于获取自润滑轴承涂层厚度的二维干涉条纹图像,进而实现对自润滑轴承涂层厚度进行非接触无损检测。

Cite:

Copy from the list or Export to your reference management。

GB/T 7714 黄异 , 钟舜聪 , 陈志雄 et al. 一种基于光学干涉的自润滑轴承涂层厚度检测装置 : CN202221788563.8[P]. | 2022-07-12 00:00:00 .
MLA 黄异 et al. "一种基于光学干涉的自润滑轴承涂层厚度检测装置" : CN202221788563.8. | 2022-07-12 00:00:00 .
APA 黄异 , 钟舜聪 , 陈志雄 , 庄彩虹 , 林杰文 , 张秋坤 et al. 一种基于光学干涉的自润滑轴承涂层厚度检测装置 : CN202221788563.8. | 2022-07-12 00:00:00 .
Export to NoteExpress RIS BibTex

Version :

Dynamic Characterization of Optical Coherence-Based Displacement-Type Weight Sensor SCIE
期刊论文 | 2023 , 23 (21) | SENSORS
Abstract&Keyword Cite Version(2)

Abstract :

Dynamic characteristics play a crucial role in evaluating the performance of weight sensors and are essential for achieving fast and accurate weight measurements. This study focuses on a weight sensor based on optical coherence displacement. Using finite element analysis, the sensor was numerically simulated. Frequency domain and time domain dynamic response characteristics were explored through harmonic response analysis and transient dynamic analysis. The superior dynamic performance and reduced conditioning time of the non-contact optical coherence-based displacement weight sensor were confirmed via a negative step response experiment that compared the proposed sensing method to strain sensing. Moreover, dynamic performance metrics for the optical coherence displacement-type weight sensor were determined. Ultimately, the sensor's dynamic performance was enhanced using the pole-zero placement method, decreasing the overshoot to 4.72% and reducing the response time to 0.0132 s. These enhancements broaden the sensor's operational bandwidth and amplify its dynamic response capabilities.

Keyword :

displacement type displacement type dynamic characteristics dynamic characteristics optical coherence optical coherence weight sensor weight sensor

Cite:

Copy from the list or Export to your reference management。

GB/T 7714 Lai, Zhengchuang , Ouyang, Zhongjie , Zhong, Shuncong et al. Dynamic Characterization of Optical Coherence-Based Displacement-Type Weight Sensor [J]. | SENSORS , 2023 , 23 (21) .
MLA Lai, Zhengchuang et al. "Dynamic Characterization of Optical Coherence-Based Displacement-Type Weight Sensor" . | SENSORS 23 . 21 (2023) .
APA Lai, Zhengchuang , Ouyang, Zhongjie , Zhong, Shuncong , Liang, Wei , Yang, Xiaoxiang , Lin, Jiewen et al. Dynamic Characterization of Optical Coherence-Based Displacement-Type Weight Sensor . | SENSORS , 2023 , 23 (21) .
Export to NoteExpress RIS BibTex

Version :

Dynamic Characterization of Optical Coherence-Based Displacement-Type Weight Sensor EI
期刊论文 | 2023 , 23 (21) | Sensors
Dynamic Characterization of Optical Coherence-Based Displacement-Type Weight Sensor Scopus
期刊论文 | 2023 , 23 (21) | Sensors (Basel, Switzerland)
基于光学相干测振系统的微悬臂梁缺陷检测 CSCD PKU
期刊论文 | 2021 , 42 (2) , 304-309 | 应用光学
Abstract&Keyword Cite Version(2)

Abstract :

提出了基于光学相干测振(optical coherence vibrometer,OCV)系统的微悬臂梁缺陷检测方法.自搭建的OCV系统最大振动位移量程、最大振动频率分别为2.574 mm和138.5 kHz,应用该系统对含缺陷微悬臂梁-附加质量块耦合结构进行振动测量获得其固有频率,并利用附加质量块对固有频率的影响特性实现了对缺陷的定位.在对系统采集到的干涉光谱信号处理的过程中,采用FFT(fast Fourier transform,FFT)+FT(Fourier transform,FT)细化频谱校正算法进行误差校正,精度可提高1000倍以上,使系统实现纳米量级的位移测量.实验结果表明,该方法能够有效识别微悬臂梁的缺陷位置,为微小型结构的缺陷检测提供了一种新的方法,同时拓展了光学相干测振技术在工程结构无损检测的应用.

Keyword :

光学相干测振 光学相干测振 微悬臂梁 微悬臂梁 缺陷检测 缺陷检测 附加质量 附加质量 频谱校正 频谱校正

Cite:

Copy from the list or Export to your reference management。

GB/T 7714 贾美英 , 钟舜聪 , 周宁 et al. 基于光学相干测振系统的微悬臂梁缺陷检测 [J]. | 应用光学 , 2021 , 42 (2) : 304-309 .
MLA 贾美英 et al. "基于光学相干测振系统的微悬臂梁缺陷检测" . | 应用光学 42 . 2 (2021) : 304-309 .
APA 贾美英 , 钟舜聪 , 周宁 , 林杰文 , 张秋坤 . 基于光学相干测振系统的微悬臂梁缺陷检测 . | 应用光学 , 2021 , 42 (2) , 304-309 .
Export to NoteExpress RIS BibTex

Version :

基于光学相干测振系统的微悬臂梁缺陷检测 CSCD PKU
期刊论文 | 2021 , 42 (02) , 304-309 | 应用光学
基于光学相干测振系统的微悬臂梁缺陷检测 CSCD PKU
期刊论文 | 2021 , 42 (02) , 304-309 | 应用光学
10| 20| 50 per page
< Page ,Total 2 >

Export

Results:

Selected

to

Format:
Online/Total:1099/14085745
Address:FZU Library(No.2 Xuyuan Road, Fuzhou, Fujian, PRC Post Code:350116) Contact Us:0591-22865326
Copyright:FZU Library Technical Support:Beijing Aegean Software Co., Ltd. 闽ICP备05005463号-1