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学者姓名：张秋坤
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Abstract ：
由于将莫尔条纹图进行快速傅里叶变换时会导致频谱泄露，导致无法实现360°的全周精确测量，因此提出基于莫尔条纹的全周转角测量方法并搭建转角测量系统。以1°为步距，利用CMOS相机采集不同宽度的莫尔条纹图像，采用快速傅里叶变换（fast Fourier transform, FFT）对条纹进行处理，得到光栅频谱信息。同时采用汉宁窗能量重心校正算法（Hanning-window energy centrobaric method, HnWECM）校正频谱，得到莫尔条纹图像表征转角的真实有效信息，实现全周精确测量。实验结果表明，该系统可快速精准地实现转角的全周测量，测量范围广，最大误差率为0.243 3%。
Keyword ：
快速傅里叶变换 快速傅里叶变换 汉宁窗能量重心法 汉宁窗能量重心法 莫尔条纹 莫尔条纹 转角测量 转角测量
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| GB/T 7714 | 许令鸿 , 张秋坤 , 林杰文 et al. 基于莫尔条纹的全周转角精密测量方法 [J]. | 应用光学 , 2024 , 45 (03) : 644-651 . |
| MLA | 许令鸿 et al. "基于莫尔条纹的全周转角精密测量方法" . | 应用光学 45 . 03 (2024) : 644-651 . |
| APA | 许令鸿 , 张秋坤 , 林杰文 , 李劲林 , 黎昕婷 , 钟舜聪 . 基于莫尔条纹的全周转角精密测量方法 . | 应用光学 , 2024 , 45 (03) , 644-651 . |
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A nonlinear chirp is always introduced to an interference fringe in the Fourier domain optical coherence tomography (FD-OCT), which can be regarded as an amplitude-modulated and frequency-modulated nonstationary signal. It is mainly caused by the non-uniform wavenumber sampling and the dispersion mismatch between the sample and the reference arms. It results in the broadening of the axial point spread function and the degradation of the axial resolution. In this paper, the parameterized instantaneous frequency estimation method (PIFEM) is applied to estimate the phase function of the chirped interference fringe to achieve the linear resampling of the wavenumber space and the rebalance of the dispersion mismatch. The proposed method is efficient and convenient that requires only two interference fringes corresponding to a mirror at different depths in the sample arm of the FD-OCT system. In addition, it is proved that the PIFEM is adapted to compensate for the depthindependent dispersion mismatch caused by the sample comprised of layered structures. The experiment results validate the performance of the proposed method.
Keyword ：
Dispersion compensation Dispersion compensation estimation estimation Optical coherence tomography Optical coherence tomography Parameterized instantaneous frequency Parameterized instantaneous frequency Wavenumber calibration Wavenumber calibration
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| GB/T 7714 | Huang, Yuexin , Deng, Yaosen , Lin, Jiewen et al. Wavenumber calibration and dispersion compensation for Fourier domain optical coherence tomography by parameterized instantaneous frequency estimation method [J]. | OPTICS AND LASER TECHNOLOGY , 2024 , 174 . |
| MLA | Huang, Yuexin et al. "Wavenumber calibration and dispersion compensation for Fourier domain optical coherence tomography by parameterized instantaneous frequency estimation method" . | OPTICS AND LASER TECHNOLOGY 174 (2024) . |
| APA | Huang, Yuexin , Deng, Yaosen , Lin, Jiewen , Zhang, Qiukun , Zhong, Shuncong . Wavenumber calibration and dispersion compensation for Fourier domain optical coherence tomography by parameterized instantaneous frequency estimation method . | OPTICS AND LASER TECHNOLOGY , 2024 , 174 . |
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To accurately measure the surface roughness of precision parts, this paper proposes a non-destructive measurement method of surface roughness using frequency-domain interferometry as the core detection principle and the Hanning window energy center method as the signal demodulation method. The corresponding relationship between the height changes of the sample surface profile and the frequency density changes in the interference signal was established, and the Hanning window energy center method was used to accurately extract the periodic frequency, which can more accurately measure the surface roughness of the sample. After the spectrum correction method, the peak signal-to-noise ratio of the system reaches 50∼60 dB. When the signal-to-noise ratio is 54.8, the theoretical measurement accuracy of the system reaches 5 nm. The vibration error generated during the actual measurement process is only 20 nm. The measurement results of the roughness measuring instrument were compared and analyzed. The experimental results showed that this system has higher measurement accuracy and accuracy, and the maximum repeatability error is 7 nm. To further verify the accuracy of the system, an atomic force microscope was used for comparison and verification. The difference between the two measurement results was 12 nm. This work provides a faster and more accurate non-destructive measurement method for surface roughness measurement. © 2024 Elsevier Ltd
Keyword ：
Frequency domain analysis Frequency domain analysis Interferometry Interferometry Roughness measurement Roughness measurement Signal to noise ratio Signal to noise ratio Surface roughness Surface roughness
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| GB/T 7714 | Zhang, Qiukun , Wang, Wenxuan , Zhong, Jialu et al. Nanoscale surface roughness measurement based on frequency-domain interferometry principle [J]. | Optics and Lasers in Engineering , 2024 , 178 . |
| MLA | Zhang, Qiukun et al. "Nanoscale surface roughness measurement based on frequency-domain interferometry principle" . | Optics and Lasers in Engineering 178 (2024) . |
| APA | Zhang, Qiukun , Wang, Wenxuan , Zhong, Jialu , Lin, Jiewen , Chen, Jinguo , Luo, Manting et al. Nanoscale surface roughness measurement based on frequency-domain interferometry principle . | Optics and Lasers in Engineering , 2024 , 178 . |
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In order to measure the group refractive index and thickness of birefringent crystals simultaneously, a method based on spectral-domain interferometry is proposed. The optical path of each reflection layer of birefringent crystal is converted into spectral interference fringe of corresponding frequency by the principle of spectral-domain interferometry, and the accurate optical path calculation is realized by fast Fourier transform and Hanning-windowed energy centrobaric method. A two-step measurement method was designed to measure the crystal thickness and group refractive index of ordinary ( o ) and extraordinary ( e ) light synchronously by comparing the changes of the optical path before and after the insertion of the sample. The comparison between experimental and theoretical results of LiNbO3 crystals shows that the accuracy of the thickness measured by this system is better than 1 mu m and the relative error of the group refractive index is better than 0.15%. The measurement method is simple to implement and has high precision, which is of practical significance for realizing the rapid and high-precision measurement of optical parameters of birefringent crystals.
Keyword ：
birefringence birefringence group refractive index group refractive index spectral-domain interferometry spectral-domain interferometry
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| GB/T 7714 | Yangmei, Zhang , Qiukun, Zhang . Simultaneous measurement of thickness and group refractive index in birefringent crystals [J]. | MEASUREMENT SCIENCE AND TECHNOLOGY , 2024 , 35 (8) . |
| MLA | Yangmei, Zhang et al. "Simultaneous measurement of thickness and group refractive index in birefringent crystals" . | MEASUREMENT SCIENCE AND TECHNOLOGY 35 . 8 (2024) . |
| APA | Yangmei, Zhang , Qiukun, Zhang . Simultaneous measurement of thickness and group refractive index in birefringent crystals . | MEASUREMENT SCIENCE AND TECHNOLOGY , 2024 , 35 (8) . |
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Electromagnetic metamaterials feature the capability of squeezing photons into hotspot regions of high intensity near-field enhancement for strong light-matter interaction, underpinning the next generation of emerging biosensors. However, randomly dispersed biomolecules around the hotspots lead to weak interactions. Here, we demonstrate an all-silicon dielectric terahertz metamaterial sensor design capable of passively trapping biomoleculars into the resonant cavities confined with powerful electric field. Specifically, multiple controllable high-quality factor resonances driven by bound states in the continuum (BIC) are realized by employing longitudinal symmetry breaking. The dielectric metamaterial sensor with nearly 15.2 experimental figure-of-merit enabling qualitative and quantitative identification of different amino acids by delivering biomolecules to the hotspots for strong light-matter interactions. It is envisioned that the presented strategy will enlighten highperformance meta-sensors design from microwaves to visible frequencies, and serve as a potential platform for microfluidic sensing, biomolecular capture, and sorting devices.
Keyword ：
All-dielectric metamaterials All-dielectric metamaterials Biosensors Biosensors Bound states in the continuum Bound states in the continuum Terahertz Terahertz
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| GB/T 7714 | Lin, Tingling , Huang, Yi , Zhong, Shuncong et al. Passive trapping of biomolecules in hotspots with all-dielectric terahertz metamaterials [J]. | BIOSENSORS & BIOELECTRONICS , 2024 , 251 . |
| MLA | Lin, Tingling et al. "Passive trapping of biomolecules in hotspots with all-dielectric terahertz metamaterials" . | BIOSENSORS & BIOELECTRONICS 251 (2024) . |
| APA | Lin, Tingling , Huang, Yi , Zhong, Shuncong , Shi, Tingting , Sun, Fuwei , Zhong, Yujie et al. Passive trapping of biomolecules in hotspots with all-dielectric terahertz metamaterials . | BIOSENSORS & BIOELECTRONICS , 2024 , 251 . |
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为保证多维力传感器测量准确度,必须对该传感器进行静态标定,因此研究多维力传感器静态标定装置具有重要意义.首先,从多维力传感器静态标定需求出发,按工作原理将目前国内外主流使用的多维力传感器静态标定装置划分为静重式和叠加式这两类.然后,介绍了砝码式、杠杆式、自动式这三种静重式多维力传感器静态标定装置和液压式、龙门式、试验机式、移动平台式、电机式这五种叠加式多维力传感器静态标定装置的工作原理,对各种装置的国内外研究现状和存在不足分别进行了评述,并分析对比了各种装置的关键技术特点及优缺点.最后,从通用性、重复性、多维力模拟能力、成本效益等方面对多维力传感器静态标定装置进行了展望,指出了装置的设计和实施面临的挑战.该研究为后续多维力传感器静态标定装置的研创提供了参考.
Keyword ：
串接 串接 叠加式 叠加式 多维力传感器 多维力传感器 静态标定装置 静态标定装置 静重式 静重式
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| GB/T 7714 | 梁伟 , 谢智杰 , 黎兴强 et al. 多维力传感器静态标定装置的研究进展 [J]. | 自动化仪表 , 2024 , 45 (9) : 1-13 . |
| MLA | 梁伟 et al. "多维力传感器静态标定装置的研究进展" . | 自动化仪表 45 . 9 (2024) : 1-13 . |
| APA | 梁伟 , 谢智杰 , 黎兴强 , 张秋坤 , 徐震廷 , 顾立勋 et al. 多维力传感器静态标定装置的研究进展 . | 自动化仪表 , 2024 , 45 (9) , 1-13 . |
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The flatness of semiconductor substrates is an important parameter for evaluating the surface quality of semiconductor substrates. However, existing technology cannot simultaneously achieve high measurement efficiency, large-range thickness measurement, and nanometer-level measurement accuracy in the thickness measurement of semiconductor substrates. To solve the problems, we propose to apply the method that combines spectral-domain optical coherence tomography (SD-OCT) with the Hanning-windowed energy centrobaric method (HnWECM) to measure the thickness of semiconductor substrates. The method can be employed in the full-chip thickness measurement of a sapphire substrate, which has a millimeter measuring range, nanometer-level precision, and a sampling rate that can reach up to 80 kHz. In this contribution, we measured the full-chip thickness map of a sapphire substrate by using this method and analyzed the machining characteristics. The measurement results of a high-precision mechanical thickness gauge, which is widely used for thickness measurement in the wafer fabrication process, were compared with the proposed method. The difference between these two methods is 0.373%, which explains the accuracy of the applied method to some extent. The results of 10 sets of repeatability experiments on 250 measurement points show that the maximum relative standard deviation (RSD) at this point is 0.0061%, and the maximum fluctuation is 71.0 nm. The above experimental results prove that this method can achieve the high-precision thickness measurement of the sapphire substrate and is of great significance for improving the surface quality detection level of semiconductor substrates.
Keyword ：
HnWECM HnWECM SD-OCT SD-OCT semiconductor substrate semiconductor substrate spectral-domain interferometry spectral-domain interferometry thickness measurement thickness measurement
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| GB/T 7714 | Zhong, Shuncong , He, Renyu , Deng, Yaosen et al. High-Precision Semiconductor Substrate Thickness Gauge Based on Spectral-Domain Interferometry [J]. | PHOTONICS , 2024 , 11 (5) . |
| MLA | Zhong, Shuncong et al. "High-Precision Semiconductor Substrate Thickness Gauge Based on Spectral-Domain Interferometry" . | PHOTONICS 11 . 5 (2024) . |
| APA | Zhong, Shuncong , He, Renyu , Deng, Yaosen , Lin, Jiewen , Zhang, Qiukun . High-Precision Semiconductor Substrate Thickness Gauge Based on Spectral-Domain Interferometry . | PHOTONICS , 2024 , 11 (5) . |
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In response to the high-precision and multi-dimensional force measurement requirements in the fields of biology and medicine, this paper proposes a novel three-dimensional microforce measurement method based on the broadband optical coherence. A novel, compact, and low-coupling elastic element was designed, with a maximum outer diameter of 26 mm and a capacity of 50 g in the X-, Y-, and Z-directions, respectively. The functional relationship between the displacements of the three detecting points on the elastic element and the applied external force was derived based on the elastic mechanics theory. And it was also verified by the finite element method. A self-built optics system was set up to sense the displacements of the three points on the elastic element. The experiments results showed that the resolution in the X-, Y-, and Z-directions was 0.10 mN, 0.11 mN and 0.13 mN, respectively. In the measuring range of (10-50) g, the maximum coupling rate was 4.55 %, and the maximum linear error was 4.70 %. The maximum repeatability error was only 0.615 %. The method and sensor were verified with good characteristics of high resolution, low coupling rate, high linearity and high accuracy, comparing to other reported researches. The multi-dimensional force measuring method could be used in the fields of biology and medicine.
Keyword ：
Force measurement Force measurement Micro force Micro force Optical coherence Optical coherence Three-dimensional Three-dimensional
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| GB/T 7714 | Liang, Wei , Li, Xingqiang , Zhong, Shuncong et al. Three-dimensional micro-force measurement method based on broadband optical coherence [J]. | MEASUREMENT , 2024 , 234 . |
| MLA | Liang, Wei et al. "Three-dimensional micro-force measurement method based on broadband optical coherence" . | MEASUREMENT 234 (2024) . |
| APA | Liang, Wei , Li, Xingqiang , Zhong, Shuncong , Zhang, Qiukun , Lin, Jiewen . Three-dimensional micro-force measurement method based on broadband optical coherence . | MEASUREMENT , 2024 , 234 . |
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It is particularly important to make quality evaluation for paint spraying process. This work presented an effi-cient method based on wavelet packet energy for terahertz non-destructive evaluation of organic protective paint. The wavelet packet energy analysis algorithm was summarized. Various coating structures were experi-mentally investigated using terahertz pulsed imaging system and the relative wavelet energy and the Shannon entropy of the detected signal were calculated as wavelet energy indexes. The proposed algorithm was performed on the evaluation of coating unevenness and the identification of hidden corrosion defect. The results demon-strated that the wavelet energy indexes are sensitive to coating structure change when compared to the terahertz peak-finding method, and it allowed more accurate estimate of micro corrosion defect. Therefore, the proposed approach based on wavelet packet energy could be recommended for quick quality evaluation of organic coating with terahertz non-destructive technology.
Keyword ：
Marine corrosion Marine corrosion Non-destructive test Non-destructive test Quality evaluation Quality evaluation Terahertz technology Terahertz technology Wavelet packet energy Wavelet packet energy
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| GB/T 7714 | Tu, Wanli , Zhong, Shuncong , Zhang, Qiukun et al. Quality evaluation of organic protective paints using terahertz pulse imaging technology based on wavelet packet energy method [J]. | OCEAN ENGINEERING , 2023 , 267 . |
| MLA | Tu, Wanli et al. "Quality evaluation of organic protective paints using terahertz pulse imaging technology based on wavelet packet energy method" . | OCEAN ENGINEERING 267 (2023) . |
| APA | Tu, Wanli , Zhong, Shuncong , Zhang, Qiukun , Shen, Yaochun , Incecik, Atilla . Quality evaluation of organic protective paints using terahertz pulse imaging technology based on wavelet packet energy method . | OCEAN ENGINEERING , 2023 , 267 . |
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应变式称重传感器迟滞是影响质量称量的重要影响因素之一,探索其产生因素及影响具有重要意义.本文在传统双梁型应变式称重传感器的基础上,提出了一种基于宽带光相干的弹性体位移传感测量方法,实现了弹性体弹性滞后与应变式称重传感器迟滞的同步测量,实现了弹性体弹性滞后对应变式称重传感器迟滞影响的定量评价.测试结果表明:1)基于宽带光相干的位移传感测量系统,对弹性体形变位移的测量准确度高、重复性好、性能稳定.2)弹性体弹性滞后误差和应变式传感器迟滞误差总是在所测试最大载荷的一半位置达到最大;加卸载迟滞测试所施加的载荷越大,弹性滞后误差和传感器迟滞误差也越大.3)弹性体的弹性滞后是造成应变式称重传感器迟滞的主要原因,弹性体的弹性滞后误差约占传感器迟滞误差的95％.
Keyword ：
宽带光相干 宽带光相干 应变式 应变式 弹性滞后 弹性滞后 称重传感器 称重传感器 迟滞 迟滞
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| GB/T 7714 | 杨晓翔 , 欧阳忠杰 , 梁伟 et al. 弹性滞后对双梁型应变式称重传感器迟滞特性的影响 [J]. | 厦门大学学报（自然科学版） , 2023 , 62 (4) : 567-575 . |
| MLA | 杨晓翔 et al. "弹性滞后对双梁型应变式称重传感器迟滞特性的影响" . | 厦门大学学报（自然科学版） 62 . 4 (2023) : 567-575 . |
| APA | 杨晓翔 , 欧阳忠杰 , 梁伟 , 高剑虹 , 郭金泉 , 钟舜聪 et al. 弹性滞后对双梁型应变式称重传感器迟滞特性的影响 . | 厦门大学学报（自然科学版） , 2023 , 62 (4) , 567-575 . |
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