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author:

Lin, Huisheng (Lin, Huisheng.) [1] | Shi, Tingting (Shi, Tingting.) [2] | Huang, Yi (Huang, Yi.) [3] (Scholars:黄异) | Zhong, Shuncong (Zhong, Shuncong.) [4] (Scholars:钟舜聪) | Wang, Bing (Wang, Bing.) [5] (Scholars:王冰) | Zhang, Zhenghao (Zhang, Zhenghao.) [6] | Huang, Yonglin (Huang, Yonglin.) [7]

Indexed by:

EI Scopus SCIE

Abstract:

Glass Fiber-Reinforced Polymer (GFRP) finds extensive applications in the high-end equipment manufacturing industry owing to its advantages of light weight, high strength, and corrosion resistance. Since the residual stress in GFRP builds up during the curing process and affect its mechanical properties and service life, the characterization of the residual stress in GFRP is crucial. In this study, we establish a theoretical model based on the anisotropic stress-optics law for the orthorhombic crystalline system to describe the terahertz-elasticity of GFRP and calibrate the stress optical coefficients of GFRP. First, the residual stress in GFRP at different curing temperatures are measured by fiber Bragg grating sensors. Then, the refractive index of GFRP with different residual stress are obtained based on transmission-type THz-TDS. Finally, based on the proposed photoelastic model of GFRP, the stress optical coefficients of GFRP are measured by combining the measurement results of residual stress and refractive index. The experimental results show that the refractive index of GFRP decreases with the increase of residual stress; the stress optical coefficients of GFRP are determined as q11 = -5.612 x 10-9 Pa- 1, q12 = -2.548 x 10-9 Pa- 1, q21 = -1.305 x 10- 8 Pa- 1, q22 = -1.408 x 10-9 Pa- 1. The modeling of terahertz photoelasticity in GFRP and the determination of stress optical coefficients provide a basis for characterizing residual stress in GFRP by THz-TDS.

Keyword:

GFRP Photoelastic model Residual stress Terahertz

Community:

  • [ 1 ] [Lin, Huisheng]Fuzhou Univ, Sch Mech Engn & Automat, Fujian Prov Key Lab Terahertz Funct Devices & Inte, Fuzhou 350108, Peoples R China
  • [ 2 ] [Shi, Tingting]Fuzhou Univ, Sch Mech Engn & Automat, Fujian Prov Key Lab Terahertz Funct Devices & Inte, Fuzhou 350108, Peoples R China
  • [ 3 ] [Huang, Yi]Fuzhou Univ, Sch Mech Engn & Automat, Fujian Prov Key Lab Terahertz Funct Devices & Inte, Fuzhou 350108, Peoples R China
  • [ 4 ] [Zhong, Shuncong]Fuzhou Univ, Sch Mech Engn & Automat, Fujian Prov Key Lab Terahertz Funct Devices & Inte, Fuzhou 350108, Peoples R China
  • [ 5 ] [Wang, Bing]Fuzhou Univ, Sch Mech Engn & Automat, Fujian Prov Key Lab Terahertz Funct Devices & Inte, Fuzhou 350108, Peoples R China
  • [ 6 ] [Zhang, Zhenghao]Fuzhou Univ, Sch Mech Engn & Automat, Fujian Prov Key Lab Terahertz Funct Devices & Inte, Fuzhou 350108, Peoples R China
  • [ 7 ] [Huang, Yonglin]Fuzhou Univ, Sch Mech Engn & Automat, Fujian Prov Key Lab Terahertz Funct Devices & Inte, Fuzhou 350108, Peoples R China
  • [ 8 ] [Lin, Huisheng]Fuzhou Univ, Inst Precis Instrument & Intelligent Measurement &, Fuzhou 350108, Peoples R China
  • [ 9 ] [Shi, Tingting]Fuzhou Univ, Inst Precis Instrument & Intelligent Measurement &, Fuzhou 350108, Peoples R China
  • [ 10 ] [Huang, Yi]Fuzhou Univ, Inst Precis Instrument & Intelligent Measurement &, Fuzhou 350108, Peoples R China
  • [ 11 ] [Zhong, Shuncong]Fuzhou Univ, Inst Precis Instrument & Intelligent Measurement &, Fuzhou 350108, Peoples R China
  • [ 12 ] [Wang, Bing]Fuzhou Univ, Inst Precis Instrument & Intelligent Measurement &, Fuzhou 350108, Peoples R China
  • [ 13 ] [Zhang, Zhenghao]Fuzhou Univ, Inst Precis Instrument & Intelligent Measurement &, Fuzhou 350108, Peoples R China
  • [ 14 ] [Huang, Yonglin]Fuzhou Univ, Inst Precis Instrument & Intelligent Measurement &, Fuzhou 350108, Peoples R China
  • [ 15 ] [Shi, Tingting]Minjiang Univ, Sch Econ & Management, Fuzhou 350108, Peoples R China

Reprint 's Address:

  • [Huang, Yi]Fuzhou Univ, Sch Mech Engn & Automat, Fujian Prov Key Lab Terahertz Funct Devices & Inte, Fuzhou 350108, Peoples R China;;[Zhong, Shuncong]Fuzhou Univ, Sch Mech Engn & Automat, Fujian Prov Key Lab Terahertz Funct Devices & Inte, Fuzhou 350108, Peoples R China;;

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Source :

OPTICAL MATERIALS

ISSN: 0925-3467

Year: 2024

Volume: 157

3 . 8 0 0

JCR@2023

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

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