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[期刊论文]

Experimental study of a thin thermally grown oxide layer in thermal barrier coatings based on the SWT-BP algorithm and terahertz technology

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author:

Luo, Manting (Luo, Manting.) [1] | Zhong, Shuncong (Zhong, Shuncong.) [2] (Scholars:钟舜聪) | Huang, Yi (Huang, Yi.) [3] (Scholars:黄异) | Unfold

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Abstract:

As a promising nondestructive testing (NDT) technique with a very adaptive physical modeling of wave transmission process, terahertz technology is used for the detection and characterization of nonpolar materials and the evaluation of layered and/or defective structures. THz-TDS can also be used to perform spectroscopic analysis and detect structural defects in thermal barrier coatings (TBCs) of aero-engines. Although it is generally difficult to measure the structure of the thin oxide layer of the thermal barrier coatings whose thickness is generally lower than 30 g m (the current axial resolution of the THz-TDS cannot exceed 30 g m). We were able to complete the detection of the oxide layer within 1-29 g m through simulation by using the SWT-BP algorithm. In this study, the analysis was performed on real -world samples, the fitting degree of the SWT-BP algorithm reached 0.77, and the minimum prediction error was less than 0.1 g m. The paper also put forward some improvement measures about the experimental results. (c) 2024 Optica Publishing Group

Community:

  • [ 1 ] [Luo, Manting]Putian Univ, Sch Mech Elect & Informat Engn, Putian 351100, Peoples R China
  • [ 2 ] [Zhong, Shuncong]Fuzhou Univ, Sch Mech Engn & Automat, Fuzhou 350108, Peoples R China
  • [ 3 ] [Huang, Yi]Fuzhou Univ, Sch Mech Engn & Automat, Fuzhou 350108, Peoples R China
  • [ 4 ] [Zhang, Zhenghao]Fuzhou Univ, Sch Mech Engn & Automat, Fuzhou 350108, Peoples R China
  • [ 5 ] [Nsengiyumva, Walter]Fuzhou Univ, Sch Mech Engn & Automat, Fuzhou 350108, Peoples R China
  • [ 6 ] [Zhong, Shuncong]Fuzhou Univ, Fujian Prov Key Lab Terahertz Funct Devices & Inte, Fuzhou 350108, Peoples R China
  • [ 7 ] [Huang, Yi]Fuzhou Univ, Fujian Prov Key Lab Terahertz Funct Devices & Inte, Fuzhou 350108, Peoples R China
  • [ 8 ] [Zhang, Zhenghao]Fuzhou Univ, Fujian Prov Key Lab Terahertz Funct Devices & Inte, Fuzhou 350108, Peoples R China
  • [ 9 ] [Nsengiyumva, Walter]Fuzhou Univ, Fujian Prov Key Lab Terahertz Funct Devices & Inte, Fuzhou 350108, Peoples R China
  • [ 10 ] [Tu, Wanli]Jimei Univ, Marine Engn Inst, Xiamen 361021, Peoples R China

Reprint 's Address:

  • [Luo, Manting]Putian Univ, Sch Mech Elect & Informat Engn, Putian 351100, Peoples R China;;

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Source :

APPLIED OPTICS

ISSN: 1559-128X

Year: 2024

Issue: 13

Volume: 63

Page: 3430-3437

1 . 7 0 0

JCR@2023

CAS Journal Grade:4

Cited Count:

WoS CC Cited Count: 1

SCOPUS Cited Count: 1

30 Days PV: 1

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