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author:

Zhu, Z. (Zhu, Z..) [1] | Chen, Z. (Chen, Z..) [2] | Yang, S. (Yang, S..) [3]

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Abstract:

A magnetic quasi-static (MQS) surface integral equation (SIE) formulation based on the cut set analysis (CSA) is proposed to extract parameters of interconnects in packages. The surface impedance approximation is used to describe the surface current caused by skin effect at high frequencies. To accurately model arbitrarily shaped structures, triangle meshes are selected to discretize surfaces of interconnects in the proposed formulation. After physically interpreting the discretized matrix equation as a circuit, the CSA is tailored to carefully apply the charge conservation condition. Triangles on each terminal are bounded together as a supernode to enforce currents flowing into/out interconnects. In addition, an efficient preconditioner and the pre-corrected Fast Fourier Transform (pFFT) are used to accelerate the convergence and matrix-vector product. Four numerical examples were carried out to validate the effectiveness by comparing it with the industrial solver. Our results show that the proposed formulation is accurate, efficient, and flexible to model complex interconnects at high frequencies. IEEE

Keyword:

Cut set analysis Integral equations Integrated circuit interconnections Integrated circuit modeling Integrated circuits interconnects Mathematical models parameter extraction pre-corrected Fast Fourier Transform (pFFT) supernode Surface impedance surface integral equation (SIE) Voltage

Community:

  • [ 1 ] [Zhu Z.]Research Institute for Frontier Science and the School of Electronic and Information Engineering, Beihang University, Beijing, China
  • [ 2 ] [Chen Z.]College of Physics and Information Engineering, Fuzhou University, Fuzhou, China
  • [ 3 ] [Yang S.]Research Institute for Frontier Science and the School of Electronic and Information Engineering, Beihang University, Beijing, China

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Source :

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

ISSN: 0278-0070

Year: 2024

Issue: 9

Volume: 43

Page: 1-1

2 . 7 0 0

JCR@2023

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 2

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