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author:

Tong, Wei (Tong, Wei.) [1] | Zhang, Miaomiao (Zhang, Miaomiao.) [2] | Li, Dongfang (Li, Dongfang.) [3] | Wu, Qi (Wu, Qi.) [4] | Song, Aiguo (Song, Aiguo.) [5]

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Abstract:

Learning-based Multiple-View Stereo (MVS) aims to reconstruct dense 3D scene representation. However, previous methods utilize additional 2D network modules to learn the cross view visibility for cost aggregation, ignoring the consistency assumption of 2D contextual features in the 3D depth direction. In addition, the current multi-stage depth inference model still requires a high depth sampling rate, and depth hypothesis is sampled within static and preset depth range, which is prone to generate errorneous depth inference in the object boundary and occluded area. To alleviate these problems, a multi-view stereo network based on edge assisted epipolar Transformer is proposed. The improvements of this work over the state of the art are as: Depth regression is replaced by the multi-depth hypotheses classification to ensure the accuracy with limited depth sampling rate and GPU consumption. Epipolar Transformer block is developed for reliable cross view cost aggregation, and edge detection branch is designed to constrain the consistency of edge features in the epipolar direction. A dynamic depth range sampling mechanism based on probabilistic cost volume is applied to improve the accuracy of uncertain areas. Comprehensive comparisons with the state of the art are conducted on public benchmarks, which indicate that the proposed method can reconstruct dense scene representations with limited memory bottleblock. Specifically, compared with Cas-MVSNet, the memory consumption is reducted by 35%, the depth sampling rate is reduced by about 50%, and the overall error on DTU datasets is reduced from 0.355 to 0.325. © 2023 Science Press. All rights reserved.

Keyword:

Edge detection Stereo image processing

Community:

  • [ 1 ] [Tong, Wei]School of Mechanical Engineering, Nanjing University of Science and Technology, Nanjing; 210094, China
  • [ 2 ] [Tong, Wei]School of Electronic, Information and Electrical Engineering, Shanghai Jiao Tong University, Shanghai; 200240, China
  • [ 3 ] [Zhang, Miaomiao]School of Electronic, Information and Electrical Engineering, Shanghai Jiao Tong University, Shanghai; 200240, China
  • [ 4 ] [Li, Dongfang]School of Electrical Engineering and Automation, Fuzhou University, Fuzhou; 350108, China
  • [ 5 ] [Wu, Qi]School of Electronic, Information and Electrical Engineering, Shanghai Jiao Tong University, Shanghai; 200240, China
  • [ 6 ] [Song, Aiguo]School of Instrument Science and Engineering, Southeast University, Nanjing; 210096, China

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Source :

电子与信息学报

ISSN: 1009-5896

CN: 11-4494/TN

Year: 2023

Issue: 10

Volume: 45

Page: 3483-3491

0 . 5

JCR@2023

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JCR@2023

JCR Journal Grade:4

CAS Journal Grade:4

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

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Chinese Cited Count:

30 Days PV: 0

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