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author:

She, K. (She, K..) [1] | Huang, Y. (Huang, Y..) [2] | Li, B. (Li, B..) [3] | Huang, G. (Huang, G..) [4] | Liao, W. (Liao, W..) [5] | Lin, Z. (Lin, Z..) [6] | Zhang, G. (Zhang, G..) [7]

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Abstract:

We present a method for phase retardation measurement of intracavity optical elements which is based on frequency splitting caused by weak phase anisotropy of Nd: YAG. The measurement range covers 0–π and the measurement uncertainty is less than 0.0300 rad. A theoretical analysis is provided to obtain the phase retardation of intracavity optical elements by using the phase difference or frequency difference of two eigenmodes. The minimum error is 0.0036 rad by using the composite wave plate to verify various phase retardation conditions. This work provides a rapid and accurate intracavity method for measuring the phase retardation of optical elements. © 2023 Optica Publishing Group under the terms of the Optica Open Access Publishing Agreement.

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  • [ 1 ] [She K.]Key Laboratory of Optoelectronic Materials Chemistry and Physics, Fujian Institute of Research on the Structure of Matter, Chinese Academy of Sciences, Fujian, Fuzhou, 350002, China
  • [ 2 ] [She K.]College of Chemistry, Fuzhou University, Fujian, Fuzhou, 350108, China
  • [ 3 ] [Huang Y.]Key Laboratory of Optoelectronic Materials Chemistry and Physics, Fujian Institute of Research on the Structure of Matter, Chinese Academy of Sciences, Fujian, Fuzhou, 350002, China
  • [ 4 ] [Huang Y.]University of Chinese Academy of Sciences, Beijing, 100049, China
  • [ 5 ] [Li B.]Key Laboratory of Optoelectronic Materials Chemistry and Physics, Fujian Institute of Research on the Structure of Matter, Chinese Academy of Sciences, Fujian, Fuzhou, 350002, China
  • [ 6 ] [Li B.]Fujian Science & Technology Innovation Laboratory for Optoelectronic Information of China, Fujian, Fuzhou, 350108, China
  • [ 7 ] [Huang G.]Key Laboratory of Optoelectronic Materials Chemistry and Physics, Fujian Institute of Research on the Structure of Matter, Chinese Academy of Sciences, Fujian, Fuzhou, 350002, China
  • [ 8 ] [Huang G.]University of Chinese Academy of Sciences, Beijing, 100049, China
  • [ 9 ] [Liao W.]Key Laboratory of Optoelectronic Materials Chemistry and Physics, Fujian Institute of Research on the Structure of Matter, Chinese Academy of Sciences, Fujian, Fuzhou, 350002, China
  • [ 10 ] [Liao W.]Fujian Science & Technology Innovation Laboratory for Optoelectronic Information of China, Fujian, Fuzhou, 350108, China
  • [ 11 ] [Lin Z.]Key Laboratory of Optoelectronic Materials Chemistry and Physics, Fujian Institute of Research on the Structure of Matter, Chinese Academy of Sciences, Fujian, Fuzhou, 350002, China
  • [ 12 ] [Lin Z.]Fujian Science & Technology Innovation Laboratory for Optoelectronic Information of China, Fujian, Fuzhou, 350108, China
  • [ 13 ] [Zhang G.]Key Laboratory of Optoelectronic Materials Chemistry and Physics, Fujian Institute of Research on the Structure of Matter, Chinese Academy of Sciences, Fujian, Fuzhou, 350002, China
  • [ 14 ] [Zhang G.]Fujian Science & Technology Innovation Laboratory for Optoelectronic Information of China, Fujian, Fuzhou, 350108, China

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Source :

Optics Express

ISSN: 1094-4087

Year: 2023

Issue: 21

Volume: 31

Page: 35032-35040

3 . 2

JCR@2023

3 . 2 0 0

JCR@2023

JCR Journal Grade:2

CAS Journal Grade:2

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

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