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author:

Chen, Guang-Yong (Chen, Guang-Yong.) [1] | Xu, Hui-Lang (Xu, Hui-Lang.) [2] | Gan, Min (Gan, Min.) [3] | Chen, C. L. Philip (Chen, C. L. Philip.) [4]

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EI

Abstract:

Effective fault detection and diagnosis (FDD) is crucial in modern industry applications, but developing accurate and interpretable FDD models for complex processes remains a challenge. In this article, we propose a novel approach that partitions measurements into a principal component and a residual subspace, formulating the FDD model-building problem as a separable nonlinear optimization problem. To improve model interpretability, we incorporate sparse regularizers to derive sparse loadings. Taking advantage of the special separable structure presented in such problems, we present an efficient variable projection-based algorithm that significantly reduces the dimension of the parameters by solving a least-squares problem with an orthonormal constraint. This results in a reduced problem that only contains loading parameters. We further establish a significant theorem, which is essential for computing the gradient of the reduced objective function and addressing the coupling between different parts of the parameters, leading to improved identification performance of the proposed algorithm. Numerical results on synthetic and real-world datasets demonstrate that our algorithm achieves faster convergence speed and better evaluation metrics. © 1963-2012 IEEE.

Keyword:

Computation theory Fault detection Hidden Markov models Nonlinear programming Parameter estimation Principal component analysis Three dimensional computer graphics

Community:

  • [ 1 ] [Chen, Guang-Yong]Fuzhou University, College of Computer and Data Science, Fuzhou; 350116, China
  • [ 2 ] [Xu, Hui-Lang]Fuzhou University, College of Computer and Data Science, Fuzhou; 350116, China
  • [ 3 ] [Gan, Min]Fuzhou University, College of Computer and Data Science, Fuzhou; 350116, China
  • [ 4 ] [Gan, Min]Qingdao University, College of Computer Science and Technology, Qingdao; 266071, China
  • [ 5 ] [Chen, C. L. Philip]South China University of Technology, School of Computer Science and Engineering, Guangzhou; 510006, China

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Source :

IEEE Transactions on Instrumentation and Measurement

ISSN: 0018-9456

Year: 2023

Volume: 72

5 . 6

JCR@2023

5 . 6 0 0

JCR@2023

ESI HC Threshold:35

JCR Journal Grade:1

CAS Journal Grade:2

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count: 2

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 3

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