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author:

Gao, Jian-Hong (Gao, Jian-Hong.) [1] | Guo, Mou-Fa (Guo, Mou-Fa.) [2] (Scholars:郭谋发) | Lin, Shuyue (Lin, Shuyue.) [3] | Chen, Duan-Yu (Chen, Duan-Yu.) [4]

Indexed by:

EI Scopus SCIE

Abstract:

The diagnosis of high-impedance fault (HIF) is a critical challenge due to the presence of faint signals that exhibit distortion and randomness. In this study, we propose a novel diagnostic approach for HIF based on semantic segmentation of the signal envelope (SE) and Hilbert marginal spectrum (HMS). The proposed approach uses 1DUNet to identify the transient process of potential fault events in zero-sequence voltage to judge fault inception. Longer timescale zero-sequence voltage is then used to extract SE and HMS, representing HIF distortion and randomness characteristics. These features are transformed into images, and ResNet18 is employed to detect the presence of HIF. An industrial prototype of the proposed approach has been implemented and validated in a 10 kV test system. The experimental results indicate that the proposed approach outperforms the comparison by a significant margin regarding triggering deviation and detection accuracy, particularly in resonant distribution networks.

Keyword:

Deep learning Fault detection Fault triggering High -impedance fault diagnosis Hilbert marginal spectrum Resonant distribution networks Semantic segmentation Signal envelope Single-phase ground fault

Community:

  • [ 1 ] [Gao, Jian-Hong]Fuzhou Univ, Coll Elect Engn & Automat, Fuzhou 350108, Peoples R China
  • [ 2 ] [Guo, Mou-Fa]Fuzhou Univ, Coll Elect Engn & Automat, Fuzhou 350108, Peoples R China
  • [ 3 ] [Lin, Shuyue]Univ Hull, Sch Engn, Kingston Upon Hull HU67RX, England
  • [ 4 ] [Gao, Jian-Hong]Yuan Ze Univ, Dept Elect Engn, Taoyuan 32003, Taiwan
  • [ 5 ] [Chen, Duan-Yu]Yuan Ze Univ, Dept Elect Engn, Taoyuan 32003, Taiwan

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Source :

EXPERT SYSTEMS WITH APPLICATIONS

ISSN: 0957-4174

Year: 2023

Volume: 231

7 . 5

JCR@2023

7 . 5 0 0

JCR@2023

ESI Discipline: ENGINEERING;

ESI HC Threshold:35

JCR Journal Grade:1

CAS Journal Grade:2

Cited Count:

WoS CC Cited Count: 31

SCOPUS Cited Count: 36

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 5

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