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author:

Guo, M. (Guo, M..) [1] | Liu, W. (Liu, W..) [2] | Gao, J. (Gao, J..) [3] | Chen, D. (Chen, D..) [4]

Indexed by:

Scopus

Abstract:

It is still a huge challenge for data-driven methods to detect high impedance fault (HIF) within limited field fault data. Even more, classification of imbalanced data has encountered a significant degradation in predictive performance since most classifiers were trained with the premise of a relatively balanced distribution. In this paper, a data-driven methodology combined with generative adversarial network (GAN) for HIF detection with imbalanced sample scenarios is proposed. By extending the structure and specializing loss function, the improved GAN (IGAN) can be established to learn the intrinsical probability distribution of raw data and sample new HIF data easily. Adding the high-quality dummy fault data into the original imbalanced training data set, equitable predictive accuracy can be achieved and unbiased classification models are available. Experimental results revealed that the proposed method can generate data subject to target distribution outperformed existing methods. Moreover, the validation results on filed data revealed that the proposed method can detect HIF at around 60 ms with fairly higher accuracy on imbalanced samples compared to mainstream data-driven algorithms. IEEE

Keyword:

Convolutional neural networks Data enhancement Data models fault detection Fault detection Feature extraction generative adversarial network Generative adversarial networks high impedance fault imbalanced sample Impedance Training

Community:

  • [ 1 ] [Guo, M.]College of Electrical Engineering and Automation, Fuzhou University, Fuzhou, China
  • [ 2 ] [Liu, W.]College of Electrical Engineering and Automation, Fuzhou University, Fuzhou, China
  • [ 3 ] [Gao, J.]College of Electrical Engineering and Automation, Fuzhou University, Fuzhou, China
  • [ 4 ] [Chen, D.]College of Electrical Engineering, Yuan Ze University, Taoyuan, Taiwan

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Source :

IEEE Transactions on Industry Applications

ISSN: 0093-9994

Year: 2023

Issue: 4

Volume: 59

Page: 1-14

4 . 2

JCR@2023

4 . 2 0 0

JCR@2023

ESI HC Threshold:35

JCR Journal Grade:1

CAS Journal Grade:2

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count: 6

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 1

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