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author:

Zhao, Qingsong (Zhao, Qingsong.) [1] | Liu, Ximeng (Liu, Ximeng.) [2] (Scholars:刘西蒙) | Xu, Huanliang (Xu, Huanliang.) [3] | Li, Yanbin (Li, Yanbin.) [4]

Indexed by:

EI Scopus SCIE

Abstract:

The central contribution of the current paper is to establish a practical and effective reusable garbled circuit scheme with parallel updates, where each update is applied to the circuit in parallel. First of all, we present a strengthened notion of inner product functional encryption (IPE) called simulation-based security (SIM-security) for multi-instance and show that a secret-key IPE scheme is multi-instance SIM-secure. Then we put forward a reusable garbled circuit scheme based on the IPE scheme. The idea is a reduction from re-randomizable garbled circuits in which the distribution of the original garbled circuit is computationally indistinguishable from the re-randomized garbled circuit. Finally, we implemented reusable garbled circuits and validate the practicality of our reusable garbled circuit scheme. Experimental results demonstrate that our reusable garbled circuit scheme is suitable for a wide range of real-world scenarios.

Keyword:

Re-randomizable garbled circuits Reusable garbled circuits Secret-key IPE SIM-security for multi-instance

Community:

  • [ 1 ] [Zhao, Qingsong]Nanjing Agr Univ, Coll Artificial Intelligence, Nanjing, Peoples R China
  • [ 2 ] [Xu, Huanliang]Nanjing Agr Univ, Coll Artificial Intelligence, Nanjing, Peoples R China
  • [ 3 ] [Li, Yanbin]Nanjing Agr Univ, Coll Artificial Intelligence, Nanjing, Peoples R China
  • [ 4 ] [Zhao, Qingsong]Beijing Univ Posts & Telecommun, State Key Lab Networking & Switching Technol, Beijing, Peoples R China
  • [ 5 ] [Liu, Ximeng]Fuzhou Univ, Coll Comp & Data Sci, Fuzhou, Peoples R China

Reprint 's Address:

  • [Liu, Ximeng]Fuzhou Univ, Coll Comp & Data Sci, Fuzhou, Peoples R China;;

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Source :

COMPUTER STANDARDS & INTERFACES

ISSN: 0920-5489

Year: 2023

Volume: 86

4 . 1

JCR@2023

4 . 1 0 0

JCR@2023

ESI Discipline: COMPUTER SCIENCE;

ESI HC Threshold:32

JCR Journal Grade:1

CAS Journal Grade:2

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count: 2

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 1

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