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author:

Xia, Z. (Xia, Z..) [1] | Huang, R. (Huang, R..) [2] | Chen, Z. (Chen, Z..) [3] | Yu, K. (Yu, K..) [4] | Zhang, Z. (Zhang, Z..) [5] | Salas-Avila, J.R. (Salas-Avila, J.R..) [6] | Yin, W. (Yin, W..) [7]

Indexed by:

Scopus

Abstract:

Eddy current (EC) testing has become one of the most common techniques for measuring metallic planar structures in various industrial scenarios such as infrastructures, automotive, manufacturing, and chemical engineering. There has been significant progress in measuring the geometry, electromagnetic properties, and defects of metallic planar structures based on electromagnetic principles. In this review, we summarize recent developments in EC computational models, systems, algorithms, and measurement approaches for planar structures. First, the computational models including analytical models, numerical methods, and plate property estimation algorithms are introduced. Subsequently, the impedance measurement system and probes are presented. In plate measurements, sensor signals are sensitive to probe lift-off, and various algorithms for reducing the lift-off effect are reviewed. These approaches can be used for measureing thickness and electromagnetic properties. Furthermore, defect detection for metallic plates is also discussed. © 2022 by the authors.

Keyword:

eddy current testing electromagnetic induction measurement planar structure theoretical calculation

Community:

  • [ 1 ] [Xia, Z.]School of Electrical and Electronic Engineering, University of Manchester, Manchester, M13 9PL, United Kingdom
  • [ 2 ] [Huang, R.]College of Electrical Engineering and Automation, Fuzhou University, Fuzhou, 350108, China
  • [ 3 ] [Chen, Z.]School of Electrical and Electronic Engineering, University of Manchester, Manchester, M13 9PL, United Kingdom
  • [ 4 ] [Yu, K.]School of Electrical and Electronic Engineering, University of Manchester, Manchester, M13 9PL, United Kingdom
  • [ 5 ] [Zhang, Z.]School of Instrument and Electronics, North University of China, Taiyuan, 030051, China
  • [ 6 ] [Salas-Avila, J.R.]MAIERIC Ltd, Manchester, M15 6SZ, United Kingdom
  • [ 7 ] [Yin, W.]School of Electrical and Electronic Engineering, University of Manchester, Manchester, M13 9PL, United Kingdom

Reprint 's Address:

  • [Yin, W.]School of Electrical and Electronic Engineering, United Kingdom

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Source :

Sensors

ISSN: 1424-8220

Year: 2022

Issue: 22

Volume: 22

3 . 9

JCR@2022

3 . 4 0 0

JCR@2023

ESI HC Threshold:74

JCR Journal Grade:2

CAS Journal Grade:2

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count: 6

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

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