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author:

Gu, Tianqi (Gu, Tianqi.) [1] | Luo, Zude (Luo, Zude.) [2] | Guo, Tong (Guo, Tong.) [3] | Luo, Tianzhi (Luo, Tianzhi.) [4]

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EI

Abstract:

Measurement data sometimes contain a few outliers that have a large deviation from the actual value. For such data, the reconstruction results will be greatly distorted around the outliers. To solve this problem, a robust surface approximation method based on moving total least squares (MTLSs) is presented in this article, in which an improved random sample consensus (RANSAC) and classification and regression tree (CART) are introduced into the support domain to detect outliers. First, the residuals of points in the support domain are calculated by the improved RANSAC with an introduced parameter, and then, the abnormal residuals are identified by the CART algorithm. The points corresponding to abnormal residuals are considered as abnormal points. After the abnormal points are eliminated, the remaining data are processed by weighted total least squares (WTLSs) to obtain local fitting parameters. This method can avoid the adverse impact of human intervention and over elimination. The reconstruction results of the numerical simulation and measurement experiment illustrate the effectiveness of our method. © 1963-2012 IEEE.

Keyword:

Forestry Least squares approximations Numerical methods Statistics Surface reconstruction Surface roughness Surface treatment Trees (mathematics)

Community:

  • [ 1 ] [Gu, Tianqi]Fuzhou University, School of Mechanical Engineering and Automation, Fuzhou; 350108, China
  • [ 2 ] [Luo, Zude]Fuzhou University, School of Mechanical Engineering and Automation, Fuzhou; 350108, China
  • [ 3 ] [Guo, Tong]Fuzhou University, School of Mechanical Engineering and Automation, Fuzhou; 350108, China
  • [ 4 ] [Luo, Tianzhi]University of Science and Technology of China, Department of Modern Mechanics, Hefei; 230022, China

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IEEE Transactions on Instrumentation and Measurement

ISSN: 0018-9456

Year: 2022

Volume: 71

5 . 6

JCR@2022

5 . 6 0 0

JCR@2023

ESI HC Threshold:66

JCR Journal Grade:1

CAS Journal Grade:2

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

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Chinese Cited Count:

30 Days PV: 0

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