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author:

Wang, Qiujie (Wang, Qiujie.) [1] | Jin, Tao (Jin, Tao.) [2] (Scholars:金涛) | Mohamed, Mohamed A. (Mohamed, Mohamed A..) [3]

Indexed by:

EI Scopus SCIE

Abstract:

The speed and robustness of fault section location directly affect the resilience of the distribution network when the latter is exposed to extreme events. This article is proposing a fast and robust fault section location method for distribution system considering the outage reports from smart meters in low-voltage network and notifications from remote fault indicators (RFIs) in medium-voltage network. To make section location faster, a proposed location model moves underreporting variables and misreporting variables to offline recognition. To make section location more robust, the location model proposes new constraints of expected RFI states to remove the limitation of multiple faults on different paths to all sources. Simulation results on a utility feeder with distributed generations demonstrate that the proposed method has faster location and better robustness, which is helpful to the resilience enhancement of the distribution network.

Keyword:

Distribution network Distribution networks Linear programming Network topology Optimization power outages management remote fault indicators (RFIs) resilience section location smart meters (SMs) Substations Switches Topology

Community:

  • [ 1 ] [Wang, Qiujie]China Three Gorges Univ, Coll Elect Engn & New Energy, Yichang 443000, Peoples R China
  • [ 2 ] [Wang, Qiujie]Fuzhou Univ, Dept Elect Engn, Fuzhou 350116, Peoples R China
  • [ 3 ] [Jin, Tao]Fuzhou Univ, Dept Elect Engn, Fuzhou 350116, Peoples R China
  • [ 4 ] [Mohamed, Mohamed A.]Fuzhou Univ, Dept Elect Engn, Fuzhou 350116, Peoples R China
  • [ 5 ] [Mohamed, Mohamed A.]Minia Univ, Fac Engn, Elect Engn Dept, Al Minya 61519, Egypt

Reprint 's Address:

  • 金涛

    [Jin, Tao]Fuzhou Univ, Dept Elect Engn, Fuzhou 350116, Peoples R China;;[Mohamed, Mohamed A.]Fuzhou Univ, Dept Elect Engn, Fuzhou 350116, Peoples R China;;[Mohamed, Mohamed A.]Minia Univ, Fac Engn, Elect Engn Dept, Al Minya 61519, Egypt

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Source :

IEEE SYSTEMS JOURNAL

ISSN: 1932-8184

Year: 2021

Issue: 2

Volume: 16

Page: 1954-1964

4 . 8 0 2

JCR@2021

4 . 0 0 0

JCR@2023

ESI Discipline: COMPUTER SCIENCE;

ESI HC Threshold:106

JCR Journal Grade:2

CAS Journal Grade:2

Cited Count:

WoS CC Cited Count: 16

SCOPUS Cited Count: 12

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

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