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author:

Ma, Yanyang (Ma, Yanyang.) [1] | Yin, Yongkai (Yin, Yongkai.) [2] | Jiang, Shan (Jiang, Shan.) [3] | Li, Xianye (Li, Xianye.) [4] | Huang, Feng (Huang, Feng.) [5] | Sun, Baoqing (Sun, Baoqing.) [6]

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Abstract:

Single pixel three-dimensional (3D) imaging technique has attracted lots of attention owing to its potential capability of working in a wide waveband. In this work, the single pixel 3D imaging is realized with the assistance of phase-shifting fringe projection. The deformed fringe images are recorded with the passive single pixel imaging technique, and the 3D information of the object is calculated with the phase information recovered from the deformed fringe images. The accuracy of 3D reconstruction is guaranteed with well-designed system calibration. The validity of proposed system is demonstrated in experiments. © 2021 Elsevier Ltd

Keyword:

Imaging systems Pixels

Community:

  • [ 1 ] [Ma, Yanyang]Shandong Provincial Key Laboratory of Laser Technology and Application, School of Information Science and Engineering, Shandong University, Qingdao; 266237, China
  • [ 2 ] [Yin, Yongkai]Shandong Provincial Key Laboratory of Laser Technology and Application, School of Information Science and Engineering, Shandong University, Qingdao; 266237, China
  • [ 3 ] [Jiang, Shan]Shandong Provincial Key Laboratory of Laser Technology and Application, School of Information Science and Engineering, Shandong University, Qingdao; 266237, China
  • [ 4 ] [Li, Xianye]Shandong Provincial Key Laboratory of Laser Technology and Application, School of Information Science and Engineering, Shandong University, Qingdao; 266237, China
  • [ 5 ] [Huang, Feng]School of Mechanical Engineering and Automation, Fuzhou University, Fuzhou; 350108, China
  • [ 6 ] [Sun, Baoqing]Shandong Provincial Key Laboratory of Laser Technology and Application, School of Information Science and Engineering, Shandong University, Qingdao; 266237, China

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Source :

Optics and Lasers in Engineering

ISSN: 0143-8166

Year: 2021

Volume: 140

5 . 6 6 6

JCR@2021

3 . 5 0 0

JCR@2023

ESI HC Threshold:105

JCR Journal Grade:1

CAS Journal Grade:2

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count: 36

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

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