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author:

Guo, Mou-Fa (Guo, Mou-Fa.) [1] | Gao, Jian-Hong (Gao, Jian-Hong.) [2] | Shao, Xiang (Shao, Xiang.) [3] | Chen, Duan-Yu (Chen, Duan-Yu.) [4]

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EI

Abstract:

Nowadays, smart monitoring devices such as digital fault indicator (DFI) have been installed in distribution systems to provide sufficient information for fault location. However, it is still a challenge to extract effective features from massive data for single-line-to-ground (SLG) fault-section location. This work proposes a novel method of fault-section location using a 1-D convolutional neural network (1-D CNN) and waveform concatenation. After SLG fault occurs, DFI measures the transient zero-sequence currents at double-ends of the line section, which could be concatenated to construct characteristic waveform. The features of characteristic waveforms would be extracted adaptively by 1-D CNN to locate the fault section. Furthermore, the problem where the on-site recorded data are hard to collect would be solved because 1-D CNN only needs a small number of samples for training in practical applications. The experimental results verified that the proposed method could work effectively under various fault conditions, even if a few DFIs are out of order. © 1963-2012 IEEE.

Keyword:

Convolution Convolutional neural networks Damage detection Digital devices Electric grounding Location

Community:

  • [ 1 ] [Guo, Mou-Fa]College of Electrical Engineering and Automation, Fuzhou University, Fuzhou, China
  • [ 2 ] [Gao, Jian-Hong]College of Electrical Engineering and Automation, Fuzhou University, Fuzhou, China
  • [ 3 ] [Gao, Jian-Hong]Department of Electrical Engineering, Yuan Ze University, Taoyuan, Taiwan
  • [ 4 ] [Shao, Xiang]College of Electrical Engineering and Automation, Fuzhou University, Fuzhou, China
  • [ 5 ] [Chen, Duan-Yu]Department of Electrical Engineering, Yuan Ze University, Taoyuan, Taiwan

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Source :

IEEE Transactions on Instrumentation and Measurement

ISSN: 0018-9456

Year: 2021

Volume: 70

5 . 3 3 2

JCR@2021

5 . 6 0 0

JCR@2023

ESI HC Threshold:105

JCR Journal Grade:1

CAS Journal Grade:2

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count: 58

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 3

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