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author:

Xu, Qifeng (Xu, Qifeng.) [1] | Huang, Yifan (Huang, Yifan.) [2] | Xie, Nan (Xie, Nan.) [3] | Tan, Qiao (Tan, Qiao.) [4] | Xu, Yuting (Xu, Yuting.) [5]

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EI PKU

Abstract:

There are three big defects in the existing optical voltage transducers (OVTs). The first one is that the measurement mode had optical power dependence, the second one is a non-linear measurement, and the third one is that the inherent half-wave voltage of the crystal limits the measurement range and measurement sensitivity. These defects severely impair the reliability and accuracy of OVT's long- term operation. The idea to solve the above problem is to achieve direct linear measurement of the electro-optic phase delay. To this end, this paper presented a linear OVT based on a strip aluminum polarization grating (SAPG). It was a synchronous translation that directly converts the electro-optical phase delay into a spot image, and used a position-sensitive detector to position the spot to achieve linear measurement of voltage. This method overcomes the above three principle defects, and improves temperature drift. The measurement range of the electro-optical phase delay reached ±100 degrees, and the measurement accuracy reached 0.2 level. © 2021 Chin. Soc. for Elec. Eng.

Keyword:

Aluminum Defects Optical sensors Polarization

Community:

  • [ 1 ] [Xu, Qifeng]College of Electric Engineering and Automation, Fuzhou University, Fuzhou; 350116, China
  • [ 2 ] [Huang, Yifan]College of Electric Engineering and Automation, Fuzhou University, Fuzhou; 350116, China
  • [ 3 ] [Xie, Nan]College of Electric Engineering and Automation, Fuzhou University, Fuzhou; 350116, China
  • [ 4 ] [Tan, Qiao]College of Computer and Control Engineering, Minjiang University, Fuzhou; 350116, China
  • [ 5 ] [Xu, Yuting]College of Electric Engineering and Automation, Fuzhou University, Fuzhou; 350116, China

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Source :

Proceedings of the Chinese Society of Electrical Engineering

ISSN: 0258-8013

Year: 2021

Issue: 7

Volume: 41

Page: 2556-2564

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count: 4

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 2

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