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author:

Yao, Haizi (Yao, Haizi.) [1] | Mei, Hongying (Mei, Hongying.) [2] | Zhang, Weiwei (Zhang, Weiwei.) [3] | Zhong, Shuncong (Zhong, Shuncong.) [4] (Scholars:钟舜聪) | Wang, Xiangfeng (Wang, Xiangfeng.) [5] (Scholars:王向峰)

Indexed by:

EI SCIE

Abstract:

A terahertz metamaterial refractive index/thickness sensor with flexible substrate, exhibiting low-frequency Fano resonance and high-frequency electromagnetically induced transparent (EIT) resonance, is proposed. The physical formation mechanisms of Fano and EIT resonances are investigated by calculating the electromagnetic field. Simulated results demonstrate that the refractive index sensing sensitivity based these two resonances are up to 60 and 100 GHz/RIU, and the thickness sensing sensitivity are up to 1 and 1.7 GHz/mu m, respectively. Furthermore, the proposed sensor was fabricated using femtosecond laser etching technology, and its sensing performance was verified by the experimental results that it can distinguish different liquids and detect the polyimide film with different thicknesses less than 180 mu m. The remarkable performances make the proposed metamaterial sensor has feasible capability for biological and chemical sensing in terahertz range.

Keyword:

biosensors Metamaterials Refractive index refractive index sensing Resonant frequency Sensitivity Sensors Substrates Terahertz metamaterials thickness measurement

Community:

  • [ 1 ] [Yao, Haizi]Huanghuai Univ, Sch Energy Engn, Zhumadian 463600, Henan, Peoples R China
  • [ 2 ] [Mei, Hongying]Huanghuai Univ, Sch Informat Engn, Zhumadian 463600, Henan, Peoples R China
  • [ 3 ] [Zhang, Weiwei]Hebei GEO Univ, Sch Math & Phys, Shijiazhuang 050031, Hebei, Peoples R China
  • [ 4 ] [Zhong, Shuncong]Fuzhou Univ, Sch Mech Engn & Automat, OpticalfrHz & Nondestruct Testing Lab, Fuzhou 350108, Fujian, Peoples R China
  • [ 5 ] [Wang, Xiangfeng]Fuzhou Univ, Sch Mech Engn & Automat, OpticalfrHz & Nondestruct Testing Lab, Fuzhou 350108, Fujian, Peoples R China

Reprint 's Address:

  • [Yao, Haizi]Huanghuai Univ, Sch Energy Engn, Zhumadian 463600, Henan, Peoples R China

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Source :

IEEE PHOTONICS JOURNAL

ISSN: 1943-0655

Year: 2022

Issue: 1

Volume: 14

2 . 4

JCR@2022

2 . 1 0 0

JCR@2023

ESI Discipline: PHYSICS;

ESI HC Threshold:55

JCR Journal Grade:3

CAS Journal Grade:4

Cited Count:

WoS CC Cited Count: 14

SCOPUS Cited Count: 27

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 2

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