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Abstract:
In this paper, we propose a novel edge consistency metric for multi-modal correspondence. It is based on a novel observation on image truncated SVD (singular value decomposition) termed regression robustness, which describes the fact that, a good approximation from image truncated SVD can be inherited even if the eigen-images change due to expansion and channel-dependent offsets. Compared to state-of-the-arts, multi-modal edge consistency metric can simultaneously handle multiple images with complex modality changes, including local variation, gradient reverse, intensity order change, and texture loss. Its complexity is almost linear to pixel number. Remarkable accuracies have been achieved in experiments.
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IEEE SIGNAL PROCESSING LETTERS
ISSN: 1070-9908
Year: 2021
Volume: 28
Page: 1065-1069
3 . 2 0 1
JCR@2021
3 . 2 0 0
JCR@2023
ESI Discipline: ENGINEERING;
ESI HC Threshold:105
JCR Journal Grade:2
CAS Journal Grade:3
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SCOPUS Cited Count:
ESI Highly Cited Papers on the List: 0 Unfold All
WanFang Cited Count:
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30 Days PV: 2
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