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author:

Zhu, Mingzhu (Zhu, Mingzhu.) [1] (Scholars:朱明珠) | Yu, Junzhi (Yu, Junzhi.) [2] | Gao, Zhang (Gao, Zhang.) [3] | He, Bingwei (He, Bingwei.) [4] (Scholars:何炳蔚) | Liu, Jiantao (Liu, Jiantao.) [5]

Indexed by:

EI SCIE

Abstract:

In this paper, we propose a novel edge consistency metric for multi-modal correspondence. It is based on a novel observation on image truncated SVD (singular value decomposition) termed regression robustness, which describes the fact that, a good approximation from image truncated SVD can be inherited even if the eigen-images change due to expansion and channel-dependent offsets. Compared to state-of-the-arts, multi-modal edge consistency metric can simultaneously handle multiple images with complex modality changes, including local variation, gradient reverse, intensity order change, and texture loss. Its complexity is almost linear to pixel number. Remarkable accuracies have been achieved in experiments.

Keyword:

Complexity theory edge consistency Image edge detection Linear regression Measurement multi-modal corres-pondence Mutual information Noise measurement Regression robustness Robustness singular value decomposition

Community:

  • [ 1 ] [Zhu, Mingzhu]Fuzhou Univ, Sch Mech Engn & Automat, Fuzhou 350108, Peoples R China
  • [ 2 ] [He, Bingwei]Fuzhou Univ, Sch Mech Engn & Automat, Fuzhou 350108, Peoples R China
  • [ 3 ] [Liu, Jiantao]Fuzhou Univ, Sch Mech Engn & Automat, Fuzhou 350108, Peoples R China
  • [ 4 ] [Zhu, Mingzhu]Chinese Acad Sci, Shenzhen Inst Adv Technol, Guangdong Prov Key Lab Robot & Intelligent Syst, Shenzhen 518055, Peoples R China
  • [ 5 ] [Yu, Junzhi]Peking Univ, State Key Lab Turbulence & Complex Syst, Dept Adv Mfg & Robot, BIC ESAT,Coll Engn, Beijing 100871, Peoples R China
  • [ 6 ] [Gao, Zhang]Chinese Acad Sci, Inst Automat, State Key Lab Management & Control Complex Syst, Beijing 100190, Peoples R China

Reprint 's Address:

  • [Yu, Junzhi]Peking Univ, State Key Lab Turbulence & Complex Syst, Dept Adv Mfg & Robot, BIC ESAT,Coll Engn, Beijing 100871, Peoples R China

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Source :

IEEE SIGNAL PROCESSING LETTERS

ISSN: 1070-9908

Year: 2021

Volume: 28

Page: 1065-1069

3 . 2 0 1

JCR@2021

3 . 2 0 0

JCR@2023

ESI Discipline: ENGINEERING;

ESI HC Threshold:105

JCR Journal Grade:2

CAS Journal Grade:3

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 2

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