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author:

Guo, Ente (Guo, Ente.) [1] | Chen, Zhifeng (Chen, Zhifeng.) [2] | Zhou, Yanlin (Zhou, Yanlin.) [3] | Wu, Dapeng Oliver (Wu, Dapeng Oliver.) [4]

Indexed by:

EI SCIE

Abstract:

Estimating the depth of image and egomotion of agent are important for autonomous and robot in understanding the surrounding environment and avoiding collision. Most existing unsupervised methods estimate depth and camera egomotion by minimizing photometric error between adjacent frames. However, the photometric consistency sometimes does not meet the real situation, such as brightness change, moving objects and occlusion. To reduce the influence of brightness change, we propose a feature pyramid matching loss (FPML) which captures the trainable feature error between a current and the adjacent frames and therefore it is more robust than photometric error. In addition, we propose the occlusion-aware mask (OAM) network which can indicate occlusion according to change of masks to improve estimation accuracy of depth and camera pose. The experimental results verify that the proposed unsupervised approach is highly competitive against the state-of-the-art methods, both qualitatively and quantitatively. Specifically, our method reduces absolute relative error (Abs Rel) by 0.017-0.088.

Keyword:

feature pyramid matching loss monocular depth estimation occlusion-aware mask network single camera egomotion

Community:

  • [ 1 ] [Guo, Ente]Fuzhou Univ, Coll Phys & Informat Engn, Fuzhou 350108, Peoples R China
  • [ 2 ] [Chen, Zhifeng]Fuzhou Univ, Coll Phys & Informat Engn, Fuzhou 350108, Peoples R China
  • [ 3 ] [Zhou, Yanlin]Univ Florida, Dept Elect & Comp Engn, Gainesville, FL 32611 USA
  • [ 4 ] [Wu, Dapeng Oliver]Univ Florida, Dept Elect & Comp Engn, Gainesville, FL 32611 USA

Reprint 's Address:

  • 陈志峰

    [Chen, Zhifeng]Fuzhou Univ, Coll Phys & Informat Engn, Fuzhou 350108, Peoples R China

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Source :

SENSORS

ISSN: 1424-8220

Year: 2021

Issue: 3

Volume: 21

3 . 8 4 7

JCR@2021

3 . 4 0 0

JCR@2023

ESI Discipline: CHEMISTRY;

ESI HC Threshold:117

JCR Journal Grade:2

CAS Journal Grade:3

Cited Count:

WoS CC Cited Count: 2

SCOPUS Cited Count: 4

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

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