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Abstract:
文章通过对电器寿命测试系统的软、硬件的改进,将实现在同一测试系统上可同时进行3个通道的开关测试.大大提高测试工作效率。
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湖南农机:学术版
ISSN: 1007-8320
CN: 43-1093/S
Year: 2013
Issue: 5
Volume: 40
Page: 129-130
Cited Count:
WoS CC Cited Count: 0
SCOPUS Cited Count:
ESI Highly Cited Papers on the List: 0 Unfold All
WanFang Cited Count:
Chinese Cited Count: -1
30 Days PV: 1
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