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author:

洪履燊 (洪履燊.) [1]

Abstract:

<正> 一般测量不良导体的热导率,都是采用定态平板法来测定。即把被测的不良导体的样品制成薄板,放在两块平板形状的铜块之间,而上下两铜块各自保持不同的温度,在定态下,每秒通过样品的热量,可由Fourier

Keyword:

不良导体 周围环境 测量装置 热导率 累计法

Community:

  • [ 1 ] 福州大学物理系

Reprint 's Address:

  • 洪履燊

Email:

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Source :

物理实验

ISSN: 1005-4642

CN: 22-1144/O4

Year: 1988

Issue: 05

Page: 195-198

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 4

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