• Complex
  • Title
  • Keyword
  • Abstract
  • Scholars
  • Journal
  • ISSN
  • Conference
成果搜索

author:

蔡传荣 (蔡传荣.) [1] | 张琼 (张琼.) [2]

Indexed by:

CSCD

Abstract:

单晶硅硬度压痕裂纹的特征蔡传荣张琼(福州大学,福州350002)单晶硅是电脑、光纤通信等重要材料,其表面受接触载符作用而容易损伤、产生裂纹直至破碎。为工程设计选材需要,国内外学者对其接触损伤有过研究[1][2],本文用扫描电镜观察单晶硅显微硬度压痕裂...

Keyword:

单晶硅 压痕裂纹 显微硬度压痕

Community:

  • [ 1 ] 福州大学

Reprint 's Address:

Email:

Show more details

Related Keywords:

Related Article:

Source :

电子显微学报

Year: 1996

Issue: 06

Page: 93

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 3

Affiliated Colleges:

Online/Total:220/9986130
Address:FZU Library(No.2 Xuyuan Road, Fuzhou, Fujian, PRC Post Code:350116) Contact Us:0591-22865326
Copyright:FZU Library Technical Support:Beijing Aegean Software Co., Ltd. 闽ICP备05005463号-1