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Abstract:
单晶硅硬度压痕裂纹的特征蔡传荣张琼(福州大学,福州350002)单晶硅是电脑、光纤通信等重要材料,其表面受接触载符作用而容易损伤、产生裂纹直至破碎。为工程设计选材需要,国内外学者对其接触损伤有过研究[1][2],本文用扫描电镜观察单晶硅显微硬度压痕裂...
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电子显微学报
Year: 1996
Issue: 06
Page: 93
Cited Count:
SCOPUS Cited Count:
ESI Highly Cited Papers on the List: 0 Unfold All
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30 Days PV: 3
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