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Source :
实用测试技术
ISSN: 1006-317X
CN: 51-1465/TH
Year: 1999
Page: 30-31,22
Cited Count:
SCOPUS Cited Count:
ESI Highly Cited Papers on the List: 0 Unfold All
WanFang Cited Count:
Chinese Cited Count:
30 Days PV: 1
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