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author:

吴万国 (吴万国.) [1] | 阮玉忠 (阮玉忠.) [2] (Scholars:阮玉忠) | 黄清明 (黄清明.) [3] (Scholars:黄清明)

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Abstract:

在一般情况下, 残余奥氏体的定量分析选用奥氏体的311线条作为测量的依据, 但在特殊情况下, 奥氏体的311线条极不明显, 难以测定.本文介绍在特殊情况下进行残余奥氏体定量分析的方法.

Keyword:

X射线 残余奥氏体

Community:

  • [ 1 ] [吴万国]福州大学
  • [ 2 ] [阮玉忠]福州大学
  • [ 3 ] [黄清明]福州大学

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Source :

福州大学学报(自然科学版)

ISSN: 1000-2243

CN: 35-1337/N

Year: 2002

Issue: 3

Volume: 30

Page: 385-386

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WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

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Chinese Cited Count:

30 Days PV: 2

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