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author:

孙小祥 (孙小祥.) [1] | 赵剑曦 (赵剑曦.) [2] (Scholars:赵剑曦)

Indexed by:

CQVIP PKU CSCD

Abstract:

通过讨论粒度分析仪依据的光散射原理,强调排除浓度效应的必要性,提出可用简单的外推图解法准确获得商品气相二氧化硅(F-SiO2)的分散粒径d.对F-SiO2而言,外推线性区通常在0.1% ~1.0%浓度范围内.举例说明分散粒径对F-SiO2在硫酸溶液中胶凝行为的强烈影响,发现随着分散粒径的增大,电解液的触变性增加.

Keyword:

分散粒径测试 图解法 气相二氧化硅(F-SiO2) 粒子浓度影响

Community:

  • [ 1 ] [孙小祥]福州大学
  • [ 2 ] [赵剑曦]福州大学

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Source :

电池

ISSN: 1001-1579

CN: 43-1129/TM

Year: 2015

Issue: 6

Volume: 45

Page: 340-342

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count: -1

Chinese Cited Count:

30 Days PV: 3

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