Indexed by:
Abstract:
介绍了低压成套开关设备内部故障电弧,结合标准GB/Z18859—2002及IEC/TR61641,对低压成套开关设备进行内部故障引弧试验并对试验现象进行分析,阐述了引起内部故障电弧的原因,通过对样机进行合理优化改造设计,并采取了必要的故障电弧防护措施,使得顺利通过试验,为通过引弧试验提供了参考。
Keyword:
Reprint 's Address:
Email:
Version:
Source :
电工电气
ISSN: 1007-3175
CN: 32-1800/TM
Year: 2016
Issue: 11
Page: 44-46,50
Cited Count:
SCOPUS Cited Count:
ESI Highly Cited Papers on the List: 0 Unfold All
WanFang Cited Count: -1
Chinese Cited Count:
30 Days PV: 0
Affiliated Colleges: