• Complex
  • Title
  • Keyword
  • Abstract
  • Scholars
  • Journal
  • ISSN
  • Conference
成果搜索

author:

吴王震 (吴王震.) [1] | 黄世震 (黄世震.) [2] (Scholars:黄世震)

Abstract:

本文在混频器各种线性度指标的基础上,分析了各种指标之间的内在关系,提出了在实际中如何测试混频器的1dB压缩点、IIP2和IIP3,具有一定的实用性。

Keyword:

1dB压缩点 低中频混频器 测试方法 线性度

Community:

  • [ 1 ] [吴王震]福州大学福建省集成电路重点实验室
  • [ 2 ] [黄世震]福州大学福建省集成电路重点实验室

Reprint 's Address:

Email:

Show more details

Related Keywords:

Related Article:

Source :

Year: 2008

Page: 53-55

Language: Chinese

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count: -1

Chinese Cited Count:

30 Days PV: 3

Online/Total:225/10063557
Address:FZU Library(No.2 Xuyuan Road, Fuzhou, Fujian, PRC Post Code:350116) Contact Us:0591-22865326
Copyright:FZU Library Technical Support:Beijing Aegean Software Co., Ltd. 闽ICP备05005463号-1