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author:

Yang, F. (Yang, F..) [1] | Hu, L. (Hu, L..) [2] | Lin, H. (Lin, H..) [3] | Zheng, L. (Zheng, L..) [4] | Guo, T. (Guo, T..) [5]

Indexed by:

Scopus PKU CSCD

Abstract:

A novel type of the normal-gate field emission display (FED) device with the etched dielectric layer and carbon nanotubes was fabricated. First, the cathode-gate structure, where the gate-hole and the cathode are connected, was made by etching the dielectric layer. Next, the device-grade, carbon nanotubes (CNTs) were installed into the holes by electrophoretic deposition to form the field emission dat-matrix. Finally, the prototyped FED device was packed and tested. The preliminary results show that the gate electrode is capable of precisely controlling the emission at voltages of 1500 V and 2000 V. The advantages of the newly-developed techniques over the conventional ones include simple procedure, low cost, no technical limitations in misalignment and overprinting.

Keyword:

Etching dielectric layer; Field emission; Normal-gate

Community:

  • [ 1 ] [Yang, F.]College of Physics and Information Engineering, Fuzhou University, Fuzhou 350002, China
  • [ 2 ] [Hu, L.]College of Physics and Information Engineering, Fuzhou University, Fuzhou 350002, China
  • [ 3 ] [Lin, H.]College of Physics and Information Engineering, Fuzhou University, Fuzhou 350002, China
  • [ 4 ] [Zheng, L.]College of Physics and Information Engineering, Fuzhou University, Fuzhou 350002, China
  • [ 5 ] [Guo, T.]College of Physics and Information Engineering, Fuzhou University, Fuzhou 350002, China

Reprint 's Address:

  • [Hu, L.]College of Physics and Information Engineering, Fuzhou University, Fuzhou 350002, China

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Source :

Journal of Vacuum Science and Technology

ISSN: 1672-7126

Year: 2012

Issue: 3

Volume: 32

Page: 192-195

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count: 1

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 1

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