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author:

Han, G.-Q. (Han, G.-Q..) [1] (Scholars:韩国强) | Chen, Y.-Q. (Chen, Y.-Q..) [2]

Indexed by:

Scopus PKU CSCD

Abstract:

The sources of linewidth measurement uncertainty of AFM type P47 are analyzed in details. A new model based on geometry shape of linewidth measurement is proposed. An uncertainty evaluation method is offered according to systematic analysis results in linewidth measurement. The measurement uncertainty component caused by traditional Si3N4AFM tip is about 5% of the total linewidth. Finally, the main measurement uncertainty source- AFM tip is determined.

Keyword:

Atomic force microscopy(AFM); Linewidth; Measurement uncertainty; Metrology

Community:

  • [ 1 ] [Han, G.-Q.]School of Mechanical Engineering and Automatic, Fuzhou University, Fuzhou, Fujian 350108, China
  • [ 2 ] [Han, G.-Q.]State Key Laboratory for Manufacturing System Engineering, Xi'an Jiaotong University, Shanxi Xi'an 710049, China
  • [ 3 ] [Han, G.-Q.]School of Physics and Information Engineering, Fuzhou University, Fuzhou, Fujian 350108, China
  • [ 4 ] [Chen, Y.-Q.]School of Mechanical Engineering and Automatic, Fuzhou University, Fuzhou, Fujian 350108, China

Reprint 's Address:

  • 韩国强

    [Han, G.-Q.]School of Mechanical Engineering and Automatic, Fuzhou University, Fuzhou, Fujian 350108, China

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Source :

Acta Metrologica Sinica

ISSN: 1000-1158

Year: 2012

Issue: 6

Volume: 33

Page: 486-489

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count: 1

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

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