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author:

Xie, J. (Xie, J..) [1] | Li, F. (Li, F..) [2] | Xin, Q. (Xin, Q..) [3] | Wu, C. (Wu, C..) [4] | Zhang, Y. (Zhang, Y..) [5] | Zhang, B. (Zhang, B..) [6] | Xu, S. (Xu, S..) [7] | Guo, T. (Guo, T..) [8]

Indexed by:

Scopus PKU CSCD

Abstract:

A novel type of the organic/inorganic hybrid bi-stable device has been successfully fabricated with the CdSe quantum dots (QDs) embedded in poly(N-vinylecarbasole) (PVK) as the nano-composite material. In the newly-developed device, the reversible transition between the high and low resistance states, corresponding to the write and erase processes of a digital memory device, can be realized at room temperature by applying a positive and/or negative pulsed bias. Moreover, the device has survived the high repetition of read-erase-read-write tests. The current-voltage and capacitance-voltage characteristics of the device were evaluated to understand the possible mechanisms responsible for the capture and release of the carriers in reversible transitions.

Keyword:

Carrier transport; Electrical bistability; Organic/inorganic hybrid device; Quantum dots

Community:

  • [ 1 ] [Xie, J.]College of Physics and Information Engineering, Fuzhou University, Fuzhou 350002, China
  • [ 2 ] [Li, F.]College of Physics and Information Engineering, Fuzhou University, Fuzhou 350002, China
  • [ 3 ] [Xin, Q.]College of Physics and Information Engineering, Fuzhou University, Fuzhou 350002, China
  • [ 4 ] [Wu, C.]College of Physics and Information Engineering, Fuzhou University, Fuzhou 350002, China
  • [ 5 ] [Zhang, Y.]College of Physics and Information Engineering, Fuzhou University, Fuzhou 350002, China
  • [ 6 ] [Zhang, B.]College of Physics and Information Engineering, Fuzhou University, Fuzhou 350002, China
  • [ 7 ] [Xu, S.]College of Physics and Information Engineering, Fuzhou University, Fuzhou 350002, China
  • [ 8 ] [Guo, T.]College of Physics and Information Engineering, Fuzhou University, Fuzhou 350002, China

Reprint 's Address:

  • [Li, F.]College of Physics and Information Engineering, Fuzhou University, Fuzhou 350002, China

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Source :

Journal of Vacuum Science and Technology

ISSN: 1672-7126

Year: 2013

Issue: 1

Volume: 33

Page: 30-34

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 4

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