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author:

Liao, J. (Liao, J..) [1] | Cheng, S. (Cheng, S..) [2] | Zhou, H. (Zhou, H..) [3] | Long, B. (Long, B..) [4]

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Abstract:

In this reported study, Al-doped ZnS (ZnS:Al) thin films were fabricated by chemical bath deposition in alkaline condition along with a stable complexing agent of sodium citrate in ammonia/ammonium chloride buffer solution. Al concentrations were varied from 0 to 10 at.%. The structure and composition of the films were confirmed by X-ray diffraction (XRD), Fourier transform infrared (FTIR) spectra and Raman spectroscopy. The XRD, FTIR and Raman spectra confirmed the existence of ZnS and Al-S bond, which had some effects on the properties of the films. The optical characteristics indicated the changes of the bandgap with the Al-doping concentrations. The resistivity of the ZnS:Al films with different Al-doping concentrations after annealing was analysed and the sample with 6 at.% Al concentration had the lowest resistivity of 9.9 × 10 4 Ω cm. © The Institution of Engineering and Technology 2013.

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Community:

  • [ 1 ] [Liao, J.]State Key Laboratory Breeding Base of Photocatalysis, College of Chemistry and Chemical Engineering, Fuzhou University, Fuzhou 350108, China
  • [ 2 ] [Liao, J.]Institute of Micro-Nano Devices and Solar Cells, College of Physics and Information Engineering, Fuzhou University, Fuzhou 350108, China
  • [ 3 ] [Cheng, S.]State Key Laboratory Breeding Base of Photocatalysis, College of Chemistry and Chemical Engineering, Fuzhou University, Fuzhou 350108, China
  • [ 4 ] [Cheng, S.]Institute of Micro-Nano Devices and Solar Cells, College of Physics and Information Engineering, Fuzhou University, Fuzhou 350108, China
  • [ 5 ] [Zhou, H.]Institute of Micro-Nano Devices and Solar Cells, College of Physics and Information Engineering, Fuzhou University, Fuzhou 350108, China
  • [ 6 ] [Long, B.]Institute of Micro-Nano Devices and Solar Cells, College of Physics and Information Engineering, Fuzhou University, Fuzhou 350108, China

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Source :

Micro and Nano Letters

ISSN: 1750-0443

Year: 2013

Issue: 4

Volume: 8

Page: 211-214

0 . 7 9 9

JCR@2013

0 . 9 7 5

JCR@2018

JCR Journal Grade:3

CAS Journal Grade:4

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

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Chinese Cited Count:

30 Days PV: 2

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