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Abstract：
Ti/Al soft X-ray multilayers (& utri=9.25 nm, =0.3, N=20) used at the wavelength of ∼18 nm have been designed according to the recursive optical model and the principle of material selection. © 2011 IEEE.
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Proceedings - PACCS 2011: 2011 3rd Pacific-Asia Conference on Circuits, Communications and System
Year： 2011
Language： English
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ESI Highly Cited Papers on the List： 0 Unfold All
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30 Days PV： 2
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