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author:

Zhong, D. (Zhong, D..) [1] | Teng, B. (Teng, B..) [2] | Rupp, R.A. (Rupp, R.A..) [3] | Yu, T. (Yu, T..) [4] | Wang, Q. (Wang, Q..) [5] | Zhao, Y. (Zhao, Y..) [6] | Huang, W. (Huang, W..) [7]

Indexed by:

Scopus

Abstract:

ADP (NH4H2PO4) crystals were grown through the traditional method and rapid growth technology. The optical homogeneity of rapid grown ADP crystals was analyzed by laser interferometry and X-ray topography. Laser interferometry revealed sector boundaries at which optical homogeneity decreased dramatically. The main defects that seriously reduced the optical homogeneity of the rapid grown ADP crystal were sector boundaries, growth bands and inclusions. The concentration of Fe and Cr impurities was tested by a plasma emission spectrometer. It was found that the preferential incorporation of metallic impurities into the prismatic faces resulted in high density of growth bands and inclusions, thus reducing optical homogeneity of the prismatic sector. © Science China Press and Springer-Verlag Berlin Heidelberg 2010.

Keyword:

ADP crystal; Laser interferometry; Optical homogeneity; X-ray topography

Community:

  • [ 1 ] [Zhong, D.]College of Physics Science, Qingdao University, Qingdao 266071, China
  • [ 2 ] [Teng, B.]College of Physics Science, Qingdao University, Qingdao 266071, China
  • [ 3 ] [Rupp, R.A.]TEDA Applied Physics School, Nankai University, Tianjin 300457, China
  • [ 4 ] [Yu, T.]Department of Physics, Fuzhou University, Fuzhou 350108, China
  • [ 5 ] [Wang, Q.]College of Physics Science, Qingdao University, Qingdao 266071, China
  • [ 6 ] [Zhao, Y.]College of Physics Science, Qingdao University, Qingdao 266071, China
  • [ 7 ] [Huang, W.]Beijing Synchrotron Radiation Laboratory, Institute of High Energy, Chinese Academy of Sciences, Beijing 100039, China

Reprint 's Address:

  • [Teng, B.]College of Physics Science, Qingdao University, Qingdao 266071, China

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Source :

Chinese Science Bulletin

ISSN: 1001-6538

Year: 2010

Issue: 4

Volume: 55

Page: 378-381

1 . 0 8 7

JCR@2010

1 . 6 4 9

JCR@2016

JCR Journal Grade:2

CAS Journal Grade:3

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

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