Ti/IrO2-CeO2　electrodes　were　prepared　by　thermal　decomposition　at　various　annealing　temperatures.　The　influence　of　the　annealing　temperature　on　microstructure,　morphology,　and　capacitive　performance　of　the　Ti/IrO2-CeO2　electrodes　was　investigated　by　X-ray　diffraction　(XRD),　scanning　electron　microscopy　(SEM),　cyclic　voltammetry　and　electrochemical　impedance　spectroscopy.　The　annealing　temperature　was　found　to　play　a　significant　role　in　affecting　the　microstructure　and　capacitive　performance.　The　amorphous　structure　transformed　to　crystalline　with　increasing　annealing　temperature.　The　structure　with　about　28%　amorphous　could　be　still　existed　at　460~480°C,　which　indicated　that　CeO2　could　inhibit　crystallization　of　the　IrO2.　The　Ti/IrO2-CeO2　electrodes　annealed　at　380°C　had　the　maximum　specific　capacitance　combining　with　excellent　cycling　behavior,　and　the　crystallization　degree　of　the　Ti/IrO2-CeO2　electrodes　was　about　25%.　Charge　transfer　resistance　of　the　electrode　depended　on　the　degree　of　crystallization　of　the　electrodes,　showing　a　ladder　fall　with　increasing　annealing　temperature.